• 전기화학회지
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• 제8권4호
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• pp.162-167
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• 2005

본 연구는 Pechini법을 이용하여 Ca과 Sr이 도핑된 $LaCrO_3$계의 $La_{0.6}Ca_{0.41}CrO_3$ (LCC41), $La_{0.8}Sr_{0.05}Ca_{0.15}CrO_3$, (LSCC), $La_{0.75}Ca_{0.27}CrO_3$ (LCC27) 분말들을 제조하여, 분말의 소결 특성 및 코팅층의 특성을 조사하였다. 제조된 LCC41, LSCC, LCC27 분말은 각각 0.6, 0.9, $1.5{\mu}m$의 평균 입자크기를 가졌으며, LCC41의 경우 $1400^{\circ}C$에서 98% 이상의 소결 밀도를 나타내었다. 연료극 지지체상의 LSCC 코팅은 LCC41층에 있는 Ca의 이동을 어느 정도 억제하는 역할을 하는 것으로 나타났다. 대기 용사 코팅된 LCC27은 치밀한 코팅막을 형성하였으며, 이 코팅층 위에 LCC41을 습식 코팅할 경우 더욱 치밀하고 높은 전기전도도를 갖는 코팅막을 얻을 수 있었다. 용사코팅된 LCC27, 습식 코팅된 LCC41는 높은 전기전도도를 나타내었으나, LSCC의 경우 낮은 소결성으로 인해 전기전도도가 작게 나타났다.

• Korean Chemical Engineering Research
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• 제46권6호
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• pp.1135-1141
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• 2008

고온 수증기 전기분해용 $La_{1-x}(Ca\;or\;Sr)xCrO_3$(x=0 and 0.25) 연결재 재료의 소결도와 전기 전도도에 대해서 연구하였다. 이러한 목적으로 $LaCrO_3$, $La_{0.75}Ca_{0.25}CrO_3$(LCC)와 $La_{0.75}Sr_{0.25}CrO_3$(LSC) 분말들은 공침법을 통해 합성하였으며, 결정구조는 X-Ray Diffraction(XRD)를 통해 확인하였다. 소결 특성은 상대밀도와 주사 전자현미경을 통해 분석하였고 전기 전도도는 직렬 4-단자 법으로 측정하였다. 상대 밀도 분석으로부터 도핑된 $LaCrO_3$는 $LaCrO_3$보다 더 높은 소결성을 나타내었고, 입자 크기가 작을수록 소결성이 향상하는 것을 확인 할 수 있었다. 다양한 소결온도에서 얻은 LCC, LSC 시편들의 XRD 결과는 LCC와 LSC의 소결성이 2차상의 상전이와 밀접한 관련이 있다는 사실을 나타내었다. 다시 말해, LCC는 $1,300^{\circ}C$ 이상, LSC는 $1,400^{\circ}C$ 이상에서 2차상이 융해됨으로써 소결성을 현저하게 향상시킨다는 것을 알 수 있었다. 그리고 비슷한 상대밀도를 가진 LCC와 LSC의 전기 전도도를 비교 측정한 결과, LCC가 LSC보다 더 높은 전기 전도도를 나타낸다는 것을 알 수 있었다.

• 한국결정성장학회:학술대회논문집
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• 한국결정성장학회 1996년도 The 9th KACG Technical Annual Meeting and the 3rd Korea-Japan EMGS (Electronic Materials Growth Symposium)
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• pp.258-292
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• 1996

In the last year great interest appears to YBCO thin films preparation on different substrate materials. Preparation of epitaxial film is a very difficult problem. There are many requirements to substrate materials that must be fullfilled. Main problems are lattice mismatch (misfit) and similarity of structure. From paper [1] or follows that difference in interatomic distances and angles of substrate and film is mire important problem than similarity of structure. In this work we present interatomic distances and angle relations between substrate materials belonging to ABCO4 group (where A-Sr or Ca, B-rare earth element, C-Al or Ga) of different orientations and YBCO thin films. There are many materials used as substrates for HTsC thin films. ABCO4 group of compounds is characterized by small dielectric constants (it is necessary for microwave applications of HTsC films), absence of twins and small misfit [2]. There most interesting compounds CaNdAlO4, SrLaAlO4 and SrLaGaO4 were investigated. All these compounds are of pseudo-perovskite structure with space group 14/mmm. This structure is very similar to structure of YBCO. SLG substrate has the lowest misfit (0.3%) and dielectric constant. For preparation of then films of substrates of this group of compound plane of <100> orientation are mainly used. Good quality films of <001> orientations are obtained [3]. In this case not only a-a misfit play role, but c-3b misfit is very important too. Sometimes, for preparation of thin films substrates of <001> and <110> orientations were manufactured [3]. Different misfits for different YBCO faces have been analyzed. It has been found that the mismatching factor for (100) face is very similar to that for (001) face so there is possibility of preparation of thin films on both orientations. SrLaAlO4(SLA) and SrLaGaO4(SLG) crystals of general formula ABCO4 have been grown by the Czochralski method. The quality of SLA and SLG crystals strongly depends on axial gradient of temperature and growth and rotation rates. High quality crystals were obtained at axial gradient of temperature near crystal-melt interface lower than 50℃/cm, growth rate 1-3 mm/h and the rotation rate changing from 10-20pm[4]. Strong anisotropy in morphology of SLA and SLG single crystals grown by the Czochralski method is clearly visible. On the basics of our considerations for ABCO4 type of the tetragonal crystals there can appear {001}, {101}, and {110} faces for ionic type model [5]. Morphology of these crystals depend on ionic-covalent character of bonding and crystal growth parameters. Point defects are observed in crystals and they are reflected in color changes (colorless, yellow, green). Point defects are detected in directions perpendicular to oxide planes and are connected with instability of oxygen position in lattice. To investigate facets formations crystals were doped with Cr3+, Er3+, Pr3+, Ba2+. Chromium greater size ion which is substituted for Al3+ clearly induces faceting. There appear easy {110} faces and SLA crystals crack even then the amount of Cr is below 0.3at.% SLG single crystals are not so sensitive to the content of chromium ions. It was also found that if {110} face appears at the beginning of growth process the crystal changes its color on the plane {110} but it happens only on the shoulder part. The projection of {110} face has a great amount of oxygen positions which can be easy defected. Pure and doped SLA and SLG crystals measured by EPR in the<110> direction show more intensive lines than in other directions which allows to suggest that the amount of oxygen defects on the {110} plane is higher. In order to find the origin of colors and their relation with the crystal stability, a set of SLA and SLG crystals were investigated using optical spectroscopy. The colored samples exhibit an absorption band stretching from the UV absorption edge of the crystal, from about 240 nm to about 550 m. In the case of colorless sample, the absorption spectrum consists of a relatively weak band in the UV region. The spectral position and intensities of absorption bands of SLA are typical for imperfection similar to color centers which may be created in most of oxide crystals by UV and X-radiation. It is pointed out that crystal growth process of polycomponent oxide crystals by Czochralski method depends on the preparation of melt and its stoichiometry, orientation of seed, gradient of temperature at crystal-melt interface, parameters of growth (rotation and pulling rate) and control of red-ox atmosphere during seeding and growth (rotation and pulling rate) and control of red-ox atmosphere during seeding and growth. Growth parameters have an influence on the morphology of crystal-melt interface, type and concentration of defects.