• Applied Chemistry for Engineering
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• v.17 no.6
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• pp.597-603
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• 2006

In order to study the effects of $GeO_{2}$ contents in $XSiO_{2}{\cdot}YGeO_{2}$ and $XSiO_{2}{\cdot}YNa_{2}O{\cdot}ZGeO_{2}$ compounds on far infrared ray radiation, we investigated the sample of $XSiO_{2}{\cdot}YGeO_{2}$ and $XSiO_{2}{\cdot}YNa_{2}O{\cdot}ZGeO_{2}$ using TG-DTA, XRD, FT-IR spectrophotometer and FT-IR spectrometer. The far infrared ray emissivity and emission power were increased with the increase of $GeO_{2}$ contents in $XSiO_{2}{\cdot}YGeO_{2}$ and $XSiO_{2}{\cdot}YNa_{2}O{\cdot}ZGeO_{2}$ compounds. The far infrared ray emissivity and emission power of $XSiO_2{\cdot}YGeO_2$ compounds were higher than those of $XSiO_{2}{\cdot}YNa_{2}O{\cdot}ZGeO_{2}$ compounds.