• Title/Summary/Keyword: $V_{Zn}$

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Development of ZnSSe:Te/ZnMgSSe DH structure Blue~Green tight Emitting Diodes (ZnSSe:Te/ZnMgSSe DH 구조 청색~녹색발광다이오드의 개발)

  • 이홍찬
    • Journal of Advanced Marine Engineering and Technology
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    • v.27 no.1
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    • pp.33-41
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    • 2003
  • The optical properties of $ZnS_ySe_{1-\chi-y}:Te_{\chi}(\chi<0.08,y~0.11)$ alloys grown by molecular beam epitaxy (MBE) have been investigated by photoluminescence (PL) and PL-excitation (PLE) spectroscopy. Good optical properties and high crystal quality were established with lattice match condition to GaAs substrate. At room temperature, emission in the visible spectrum region from blue to green was obtained by varying the Te content of the ZnSSe:Te alloy. The efficient blue and green emission were assigned to $Te_1 and Te_n(n\geq2)$cluster bound excitons, respectively. Bright green (535 nm) and blue (462 nm) light emitting diodes (LEDs) have been developed using ZnSSe:Te system as an active layer. The turn-on voltage of 2.1 V in current-voltage characteristics is very small compared to that of commercial InGaN-based LEDs (>3.4 V), indicating the formation of a good ohmic contact due to the optimized p-ZnSe/p-ZnTe multi-quantum well (MQW) superlattice electrode layers.

Development of latent fingerprints contaminated with ethanol on paper surfaces

  • Park, Eun-Jung;Hong, Sungwook
    • Analytical Science and Technology
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    • v.32 no.3
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    • pp.105-112
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    • 2019
  • Fingerprints may be contaminated with ethanol solutions. In order to solve the case, the law enforcement agency may need to visualize the fingerprint from these samples, but the development method has not been studied. The paper with latent fingerprint was contaminated with ethanol solution and then the blurring of ridge detail was observed. As a result, when the copy paper was contaminated with ethanol solutions of less than 75 % (v/v), the amino acid components of latent fingerprint residue blurred but lipid components of latent fingerprint residue didn't blurred. On the other hand, when the paper was contaminated with ethanol solution of more than 80 % (v/v), the amino acid components of latent fingerprint didn't blurred but the lipid components of latent fingerprint blurred. Therefore, it is found that the paper contaminated with ethanol solutions of less than 75 % (v/v) should be treated by oil red O (ORO) enhancing lipid components, and the paper contaminated with ethanol solutions of 80 % (v/v) or more should be treated by 1,2-indandione/zinc (1,2-IND/Zn) enhancing amino acid components. The blurring of ridge detail was not observed when the fingerprints were deposited with fingers contaminated with ethanol solution. This fingerprints were treated with 1,2-IND/Zn or ORO to compare the latent fingerprint development ability, and using 1,2-IND/Zn was able to visualize the latent fingerprint more clearly than using ORO.

The Potential Barrier Heights and the Carrier Densities of ZnO Varistors with Various Compositions

  • Cho, Sung-Gurl;Kwak, Min-Hwan;Lee, Sang-Ki;Kim, Hyung-Sik
    • The Korean Journal of Ceramics
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    • v.4 no.1
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    • pp.37-42
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    • 1998
  • The barrier heights and carrier densities of ZnO varistors with various compositions were estimated using C-V, J-V and $\rho$-T relations. The barrier heights obtained from C-V and J-V plots were 0.73~5.98 eV and 0.25~2.70 eV, respectively. The carrier densities estimated from C-V plots were ~$10^{18}cm^{-3}$. Acceptable values of the barrier heights and the carrier densities were obtained from $\rho$-1/T curves and the capacitances at zero bias; 0.6~0.8 eV for the barrier heights and ~$10^{17}cm^{-3}$ for carrier densities. Addition of cobalt increased the barrier height and the carrier density, while chromium slightly lowered both of them.

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Growth of ZnO thin films by MOCVD using the buffer layers grown at high temperature (고온 버퍼층을 이용한 ZnO 박막의 MOCVD 성장)

  • Kim, Dong-Chan;Kong, Bo-Hyun;Cho, Hyung-Koun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.108-109
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    • 2006
  • ZnO semiconductor has a wide band gap of 3.37 eV and a large exciton binding energy of 60 meV, and displays excellent sensing and optical properties. In particular, ZnO based 1D nanowires and nanorods have received intensive attention because of their potential applications in various fields. We grew ZnO buffer layers prior to the growth of ZnO nanorods for the fabrication of the vertically well-aligned ZnO nanorods without any catalysts. The ZnO nanorods were grown on Si (111) substrates by vertical MOCVD. The ZnO buffer layers were grown with various thicknesses at $400^{\circ}C$ and their effect on the formation of ZnO nanorods at $300^{\circ}C$ was evaluated by FESEM, XRD, and PL. The synthesized ZnO nanorods on the ZnO film show a high quality, a large-scale uniformity, and a vertical alignment along the [0001]ZnO compared to those on the Si substrates showing the randomly inclined ZnO nanorods. For sample using ZnO buffer layer, 1D ZnO nanorods with diameters of 150-200 nm were successively fabricated at very low growth temperature, while for sample without ZnO buffer the ZnO films with rough surface were grown.

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A Study on the Band Structure of ZnO/CdS Heterojunction for CIGS Solar-Cell Application

  • Sim, Hana;Lee, Jeongmin;Cho, Seongjae;Cho, Eou-Sik;Kwon, Sang Jik
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.15 no.2
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    • pp.267-275
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    • 2015
  • In this paper, ZnO films were prepared by atomic layer deposition (ALD) and CdS films were deposited using chemical bath deposition (CBD) to form ZnO/CdS heterojunction. More accurate mapping of band arrangement of the ZnO/CdS heterojunction has been performed by analyzing its electrical and optical characteristics in depth by various methods including transmittance, x-ray photoemission spectroscopy (XPS), and ultraviolet photoemission spectroscopy (UPS). The optical bandgap energies ($E_g$) of ZnO and CdS were 3.27 eV and 2.34 eV, respectively. UPS was capable of extracting the ionization potential energies (IPEs) of the materials, which turned out to be 8.69 eV and 7.30 eV, respectively. The electron affinity (EA) values of ZnO and CdS calculated from IPE and $E_g$ were 5.42 eV and 4.96 eV, respectively. Energy-band structures of the heterojunction could be accurately drawn from these parameters taking the conduction band offset (CBO) into account, which will substantially help acquisition of the full band structures of the thin films in the CIGS solar-cell device and contribute to the optimal device designs.

Growth and Optoelectric Characterization of $ZnGa_{2}Se_{4}$ Single Crystal Thin Films by Hot Wall Epitaxy (Hot Wall Epitaxy (HWE)에 의한 $ZnGa_{2}Se_{4}$ 단결정 박막 성장과 광전기적 특성)

  • Park, Chang-Sun;Hong, Kwang-Joon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.11b
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    • pp.163-166
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    • 2001
  • The stochiometric mix of evaporating materials for the $ZnGa_{2}Se_{4}$ single crystal thin films was prepared from horizontal furnace. To obtain the single crystal thin films, $ZnGa_{2}Se_{4}$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were $610^{\circ}C$ and $450^{\circ}C$, respectively. The crystalline structure of single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of $ZnGa_{2}Se_{4}$ single crystal trun films measured from Hall effect by van der Pauw method are $9.63{\times}10^{17}cm^{-3}$, $296cm^{2}/V{\cdot}s$ at 293 K, respectively. From the photocurrent spectrum by illumination of perpendicular light on the c axis of the $ZnGa_{2}Se_{4}$ single crystal thin film, we have found that the values of spin orbit splitting $\Delta$ So and the crystal field splitting $\Delta$Cr were 251.9 meV and 183.2 meV at 10 K, respectively. From the photoluminescence measurement on $ZnGa_{2}Se_{4}$ single crystal thin film, we observed free excition (Ex) existing only high quality crystal and neutral bound exiciton $(A^{0},X)$ having very strong peak intensity. Then, the full-width-at -half-maximum(FWHM) and binding energy of neutral acceptor bound excition were 11 meV and 24.4 meV, respectivity. By Haynes rule, an activation energy of impurity was 122 meV.

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Effect of Zn Content on the Corrosion Behavior of Ti-6Al-4V Alloy after Plasma Electrolytic Oxidation

  • Hwang, In-Jo;Choe, Han-Cheol
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2017.05a
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    • pp.159-159
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    • 2017
  • Ti-6Al-4V alloy have been used for dental implant because of its excellent biocompatibility, corrosion resistance, and mechanical properties. However, the integration of such implant in bone was not in good condition to achieve improved osseointergraiton. For solving this problem, calcium phosphate (CaP) has been applied as coating materials on Ti alloy implants for hard tissue applications because its chemical similarity to the inorganic component of human bone, capability of conducting bone formation and strong affinity to the surrounding bone tissue. Various metallic elements are known to play an important role in the bone formation and also affect bone mineral characteristics. Especially, Zn is essential for the growth of the human and Zn coating has a major impact on the improvement of corrosion resistance. Plasma electrolytic oxidation (PEO) is a promising technology to produce porous and firmly adherent inorganic Zn containing TiO2(Zn-TiO2)coatings on Ti surface, and the a mount of Zn introduced in to the coatings can be optimized by altering the electrolyte composition. In this study, effect of Zn content on the corrosion behavior of Ti-6Al-4V alloy after plasma electrolytic oxidation were studied by SEM, EDS, XRD, AC impedance, and potentiodynamic polarization test. The potentiodynamic polarization and AC impedance tests for corrosion behaviors were carried out in 0.9% NaCl solution at similar body temperature using a potentiostat with a scan rate of 1.67 mV/s and potential range from -1500 mV to +2000 mV. Also, AC impedance was performed at frequencies ranging from 10 MHz to 100 kHz for corrosion resistance.

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A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors

  • Yucel, H.;Birgul, O.;Uyar, E.;Cubukcu, S.
    • Nuclear Engineering and Technology
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    • v.51 no.3
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    • pp.731-737
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    • 2019
  • In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (${\mu}_e$) and electron mobility-lifetime product $({\mu}{\tau})_e$ in a CdZnTe detector. In the proposed method, the pulse rise times are derived from low energy photon response to 59.5 keV($^{241}Am$), 88 keV($^{109}Cd$) and 122 keV($^{57}Co$) ${\gamma}-rays$ for the irradiation of the cathode surface at each detector for different bias voltages. The electron $({\mu}{\tau})_e$ product was then determined by measuring the variation in the photopeak amplitude as a function of bias voltage at a given photon energy using a pulse-height analyzer. The $({\mu}{\tau})_e$ values were found to be $(9.6{\pm}1.4){\times}10^{-3}cm^2V^{-1}$ for $1000mm^3$, $(8.4{\pm}1.6){\times}10^{-3}cm^2V^{-1}$ for $1687.5mm^3$ and $(7.6{\pm}1.1){\times}10^{-3}cm^2V^{-1}$ for $2250mm^3$ CdZnTe detectors. Those results were then compared with the literature $({\mu}{\tau})_e$ values for CdZnTe detectors. The present results indicate that, the electron mobility ${\mu}_e$ and electron $({\mu}{\tau})_e$ values in CdZnTe detectors can be measured easily by applying voltage transients response to low energy photons, utilizing a fast signal acquisition and data reduction and evaluation.

Characterization of ZnO/MgZnO heterojunction grown by thermal evaporation (열기상증착법으로 성장된 ZnO/MgZnO 이종접합 나노막대의 물성분석)

  • Kong, Bo-Hyun;Jun, Sang-Ouk;Kim, Yung-Yi;Kim, Dong-Chan;Cho, Hyung-Koun;Kim, Hong-Seung
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.11a
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    • pp.11-11
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    • 2006
  • ZnO는 넓은 밴드갭(3.37eV)과 큰 액시톤(exciton) 결합에너지(60meV)를 가지는 II-VI족 화합물 반도체이다[1]. 이와같은 특성은 상온에서도 높은 재결합 효율이 기대되는 엑시톤 전이가 가능하여 자발적인 발광특성 및 레이저 발진을 위한 낮은 임계전압을 가져 일광효율이 큰 장점이 있다. 최근에는 ZnO의 전기적, 광학적, 자기적 특성을 높이기 위해 doping에 대한 연구가 많이 보고 되고 있다. 이중 ZnO내에 Mg을 doping하게 되면 Mg 조성에 따라 밴드갭이 3.3~7.7eV까지 변하게 된다. 그러나 이원계 상평형도에 따라 ZnO내에 고용될 수 있는 MgO의 고용도는 4at% 이하이다. 이는 ZnO는 Wurtzite 구조이고, MgO는 rocksalt 구조로 각각 결정구조가 다르기 때문이다. 본 연구는 열기상증착방법(thermal evaporation)으로 ZnO 템플레이트를 이용하여 MgZnO 나노막대를 합성하였고, Zn와 Mg의 서로 다른 녹는점을 이용해 2-step으로 성장을 하였다. 합성은 수평로를 사용하였으며, 반응온도 550, $700^{\circ}C$로 2-step으로 하였으며, 소스로 사용된 Zn(99.99%)과 Mg(99.99%) 분말을 산소를 직접 반응시켜 합성하였다. Ar 가스와 O2 가스를 각각 운반가스와 반응가스로 사용하였다. ZnO 템플레이트 위에 성장시킨 1차원 MgZnO 나노구조의 형태 및 구조적 특성을 FESEM과 TEM으로 분석하였다. 그리고 결정학적 특성은 XRD를 이용해 분석하였다.

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Defects and Grain Boundary Properties of ZnO with Mn3O4 Contents (Mn3O4 함량에 따른 ZnO의 결함과 입계 특성)

  • Hong, Youn-Woo;Shin, Hyo-Soon;Yeo, Dong-Hun;Kim, Jin-Ho
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.24 no.12
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    • pp.962-968
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    • 2011
  • In this study, we investigated the effects of Mn dopant (0.1~3.0 at% $Mn_3O_4$ sintered at 1000$^{\circ}C$ for 1 h in air) on the bulk trap (i.e. defect) and grain boundary properties of ZnO, ZM(0.1~3.0) using admittance spectroscopy (AS), and impedance-modulus spectroscopy (IS & MS). As a result, three kinds of defect were found below the conduction band edge of ZnO as 0.09~0.14 eV (attractive coulombic center), 0.22~25 eV ($Zn^{{\cdot}{\cdot}}_i$), and 0.32~0.33 eV ($V^{\cdot}_o$). The oxygen vacancy increased with Mn doping. In ZM, an electrically single grain boundary as double Schottky barrier was formed with 0.82~1.0 eV of activation energies by IS & MS. We also find out that the barriers of grain boundary of Mn-doped ZnO (${\alpha}$-factor=0.13) were more stabilized and homogenized with temperature compared to pure ZnO.