• 전기학회논문지P
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• 제63권1호
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• pp.46-49
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• 2014

$Pb(Zr_{0.52}Ti_{0.48})O_3(PZT)$ thin films deposited on $Ru/RuO_2$ bottom electrode that grown for in-situ progress used rf magnetron sputtering method. We investigated the dependence of the crystalline and electrical properties in the way of capacitors PZT thin films. Our results show that all PZT films indicated polycrystalline perovskite structure with preferred orientation (110) and no pyrochlore phase is observed. The electric properties of the Ru improved with increasing Ru thin films thickness. A well-fabricated Ru/PZT/Ru (100 nm) /$RuO_2$ capacitor showed a leakage current density in the order of $2.03{\times}10^{-7}$ $A/cm^2$ as a 50 kV/cm, a remnant polarization (Pr) of 9.22 ${\mu}C/cm^2$, and a coercive field (-EC) of -32.22 kV/cm. The results show that $Ru/Ru/RuO_2$ bottom electrodes are expected to reduce the degradation ferroelectric fatigue and excellent ferroelectric properties.

• 한국재료학회지
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• 제5권2호
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• pp.178-183
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• 1995

본 연구에서는 상온에서 정방성 조성인 $Pb_{0.9888}Sr_{0.012}(Zr_{0.52}Ti_{0.48})O_{3}$계 세라믹스를 소결 후 직류전계 및 코로나를 이용하는 방법으로 소결시편을 분극한 후 분극방법에 따른 시편의 압전특성을 조사하였으며, 열화현상을 평가하기 위한 방법으로 시편의 내부응력의 차이를 조사하였다. 이 결과 코로나 분극방법은 직류분극에 비하여 $30^{\circ}C$정도 저온에서도 최대 Kp값을 얻을 수 있었으며 열화현상이 천천히 진행되었고 절연파괴가 발생하지 않는 등의 장점이 관찰되었다. 그러나 Kp값은 직류분극의 경우가 코로나 분극에 비하여 약 9~10%정도 높은 값을 나타내었다.

• 한국전기전자재료학회논문지
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• 제29권8호
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• pp.466-469
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• 2016

In this study, in order to develop composition ceramics for Acoustic Emission (abbreviated as AE) sensor application, the PZT system ceramics was fabricated by conventional solid state reaction method. When x=0.48, the density, electromechanical coupling factor($k_p$), piezoelectric coefficient $d_{33}$ and piezoelectric voltage constant $g_{33}$ of the maximum values of $7.857g/cm^3$, 0.51, 190[pC/N], 52[$10^{-3}mV/N$] were obtained, respectively, suitable for AE sensor.

• 한국전기전자재료학회논문지
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• 제19권7호
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• pp.667-672
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• 2006

Ferroelectric $Pb(Zr_{0.52}Ti_{0.48})O_3$ (PZT(52/48)) thick films were fabricated by the screen-Printing method on the alumina substrates, and $PbTiO_3$ (PT) Precursor solution, which prepared by sol-gel method, was spin-coated on the PZT(52/48) thick films to obtain a densification. Its structural and electrical properties of the PZT(52/48) thick films with the treatment of PT precursor solution coating were investigated. The particle size of the thick films was increased with increasing the number of coatings and the thickness of the PZT-6 (6: number of coatings) films was about $60{\mu}m$. The relative dielectric constant increased and the dielectric loss decreased with increasing the number of PT sol coatings. The relative dielectric constant and dielectric loss of the PZT-6 thick film were 475 and 2 %, respectively. The remanent polarization, coercive field and breakdown strength of the PZT-6 film were $32.6{\mu}C/cm^2$, 15 kV/cm and 60 kV/cm, respectively.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제54권1호
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• pp.13-17
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• 2005

The Pb(Zr/sub 0.52/Ti/sub 0.48/)O₃/(Ba/sub 0.6/Sr/sub 0.4/)TiO₃[PZT/BST] heterolayered thin films were deposited on Pt/Ti/SiO₂/Si substrates by using the RF sputtering method with different RF power. The PZT/BST heterolayered thin films had the tetragonal structure of the PZT phase and BST phase. Increasing the RF power. the intensity of the PZT (100), (110) peaks and BST (111) peaks were decreased and the intensity of the BST (100), (110) peaks were increased. The thickness ratio of the top layered BST thin film and the bottom layered PZT thin film was 2 to1. The atomic concentration of the Ba, Sr, Pb. Zr, Ti atoms were constant in the PZT thin films and BST thin films, respectively. The Pt atom was diffused to the PZT region in the PZT/BST heterolayered thin films deposited at condition of 60[W] RF power. Increasing the frequency, dielectric constant and loss of the PZT/BST heterolayered thin films were decreased. The dielectric constant and loss of the PZT/BST heterolayered thin films deposited with RF power of 90[W] were 406 and 3%, respectively.

• 한국안전학회지
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• 제24권4호
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• pp.22-27
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• 2009

In this paper, the minuteness structure, piezoelectric, and dielectric characteristics of $0.95{Pb(Sb_{1/2}Nb_{1/2})_{0.02})_{0.02}(Ni_{1/3}Nb_{2/3})_{0.13}(Zr_{0.48}Ti_{0.52})_{0.85}}O_3+0.05Pb(CO_{1/2}W_{1/2})O_3+0.3%$ $MnO_2+0.3wt%$ CuO ceramics has been systematically investigated as a function of the sintering temperature after manufacturing the specimens with a general method. This study will be very helpful as basic data for developing ceramic materials, More study in a soon time for improving stability of temperature, effect of adds and stability and reality of frequency with improved production condition for specimens will give a powerful potentiality as a applied material of dielectric ceramics.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.16-16
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• 2010

The multilayer piezoelectric transformer was manufactured using $Pb(Zn_{1/2}W_{1/2})O_3-Pb(Mn_{1/3}Nb_{2/3})O_3-Pb(Zr_{0.48}Ti_{0.52})O_3$ (abbreviated as PZW-PMN-PZT) ceramics and their electrical properties were investigated. The $k_{eff}$ of the input and the output calculated from the resonant and anti-resonant frequencies were 0.403 and 0.233, respectively. The voltage step-up ratio showed the maximum value in the vicinity of 81kHz. The multilayer piezoelectric transformer showed the temperature rise of about $36^{\circ}C$ at the output power of 12w.

• 한국재료학회지
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• 제4권2호
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• pp.143-151
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• 1994

$(PbZr_{52},Ti_{48})O_{3}$인 composite ceramic target을 사용하여 R. F. 마그네트론 스퍼터링 방법으로 기판온도 $300^{\circ}C$에서 Pt/Ti/Si 기판위에 PZT 박막을 증착하였다. 페롭스 카이트 PZT박막을 얻기 위하여 PbO분위기에서 로열처리를 행하였다. 하부전극으로 Pt를 사용하였으며 Pt(205$\AA$)/Ti(500 $\AA$)/Si 및 Pt(1000$\AA$)/Ti(500$\AA$)/Si기판을 준비하여 Pt두께화 Ti층이 산소의sink로 작용함으로서 이를 가속화하였다. Ti층의 상부는 산소의 확산으로 인하여 TiOx층으로 변태하였고 하부는 in diffused Pt와 함께 실리사이드층을 형성하였다. TiOx 층의 형성은PZT층의 방향성에 영향을 주었다. 유전상수 (10kHz), 누설전류, 파괴전압, 잔류분극 및 항전계는 각각 571, 32,65$\mu A /\textrm{cm}^2$, 0.40MV/cm, 3.3$\mu C /\textrm{cm}^2$, 0.15MV/cm이었다.

• 한국산학기술학회논문지
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• 제21권8호
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• pp.222-227
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• 2020

페로부스카이트(Perovskite) 구조의 Pb(Zr,Ti)O₃(PZT)는 우수한 강유전 특성으로 인해 유전체, 압전체, 초전체 재료로 널리 사용된다. Pb_1.3(Zr_0.52Ti_0.48)O₃조성의 스퍼터링 타겟을 제조하여 RF 마그네트론 스퍼터링 공정으로 PZT박막을 형성하였다. PZT박막은 동일 스퍼터링 출력으로 연속 제조한 단층형 PZT와 2단계화한 스퍼터링 출력으로 제조한 2층형 PZT박막으로 구분하여 제조하였다. 2층형의 PZT는 저출력의 스퍼터링 조건으로 제작한 하부층과, 단층형 PZT와 동일한 조건으로 제작한 상부층으로 이루어진다. 제조한 박막에 대한 엑스선 회절분석결과, 단층형 PZT에서는 페로부스카이트상(Perovskite Phase)과 미소한 파이로클로르상(Pyrochlore Phase)이 혼합된 상태로 존재하나, 2층형 PZT에서는 페로부스카이트상만이 검출되었다. 전자현미경과 원자힘 현미경으로 표면상태를 관찰한 결과, 2층형 PZT박막의 상부는 단층형에 비해 치밀하고 평활한 표면상태를 나타냈으며, 단층형에 비해 낮은 표면거칠기값(RMS)을 보였다. 또한 이층형 PZT는 단층형에 비해 우수한 대칭성의 분극곡선형태를 보였고, 단층형에 비해 매우 저감된 1×10^-5 A/㎠ 이하수준의 누설전류 특성을 나타냈다. 이층형 PZT에서 보이는 이러한 현상은 치밀하게 형성한 하부 PZT층이 순차적으로 형성되는 상부PZT내의 미소 파이로클로르상 형성을 억제하여, 순수한 페로부스카이트상으로의 성장을 유도한 것으로 판단된다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 추계학술대회 논문집 전기물성,응용부문
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• pp.107-109
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• 2003

This paper was to measure the structure, piezoelectric properties of $0.03Pb(Mg_{0.5}W_{0.5})O_3$ - $0.12Pb(Sb_{0.5}Nb_{0.5})O_3$ - $0.85Pb(Zr_{0.52}Ti_{0.48})O_3$ + $0.5[wt%]MnO_2$ ceramics dropped with additive CuO after manufacturing the specimens with a general method. It is shown that X-ray diffraction pattern variation of lines (211) have tendency to move minutely by addition of additive CuO. According to dropping with Cu, the dielectric constant at 20[$^{\circ}C$] reduced to CuO 3.0[wt%]. In case of sintering at 1050[$^{\circ}C$], dielectric constant was maximum value 623.59 at CuO 1.0[wt%]. Dielectric loss was maximum value 2.7[%] at Cu 2.0[wt%] in case of sintering at 1050[$^{\circ}C$].