• 한국세라믹학회:학술대회논문집
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• 한국세라믹학회 2003년도 추계총회 및 연구발표회 초록집
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• pp.144.1-144
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• 2003

• 대한전자공학회논문지
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• 제17권1호
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• pp.36-39
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• 1980

5Fe₂O₃-5Bi₂O₃소결체에서 V-I특성의 규격화, theramal current runaway의 인가 step 전압의 존성, current channel의 분석등을 연구하였다. 5Fe₂O₃-5Bi₂O₃소결체의 switching 특성의 측정으로부터 전기적 switching기구는 thermal ionic breakdown으로 설명된다.

• 한국진공학회지
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• 제9권4호
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• pp.373-378
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• 2000

실리콘 기판 위에서 $TiO_2$와 $Bi_2O_3$의 박막 성장은 반응속도론 측면에서 커다란 차이를 보였지만, $Bi_4Ti_3O_{12}$(BIT) 박막의 성장은 주로 $TiO_2$ 성장 거동에 의해 지배를 받았다. 그 결과 BIT 박막은 bismuth가 부족한 조성을 가지게 되었다. 박막 내에 부족한 bismuth의 양을 보충해줌으로써 이러한 문제점을 해결하고자 펄스 주입 유기 금속 화학 기상 증착(MOCVD) 방법을 사용하였다. 이러한 펄스 주입법에 의해 bismuth의 양은 증가하였고 또한, 박막의 깊이 방향으로의 조성이 균일해졌고 $Bi_4Ti_3O_{12}$과 Si사이의 계면이 향상되었다. 게다가, $Bi_4Ti_3O_{12}$ 박막의 결정성은 크게 향상되었고 누설 전류 밀도는 연속 주입법에 비해 1/2에서 1/3정도 낮아졌다. 시계 방향의 C-V 이력 곡선이 관찰되었고 이로 인해 펄스 주입법에 의해 증착된 $Bi_4Ti_3O_{12}$ 박막은 강유전성에 의해 스위칭이 됨을 알 수 있었다.

• 한국자기학회지
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• 제13권6호
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• pp.246-250
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• 2003

고주파 대역에서 전자기적 특성이 안정적으로 유지되는 Ni-Zn 페라이트를 제조하기 위해 Ni$_{0.8}$Zn$_{0.2}$Fe$_2$O$_4$를 기본조성으로 Bi$_2$O$_3$와 CaO를 첨가하였다. Bi$_2$O$_3$의 첨가량이 0.3 wt%까지는 손실이 증가하였고 그 이상의 첨가량에서는 감소하였으며, 투자율은 Bi$_2$O$_3$ 첨가량이 증가할수록 증가하였다. Bi$_2$O$_3$와 CaO는 고용체를 형성하여 입계에 편석 됨으로서 비저항층을 형성하여 각각 0.7 wt%, CaO 0.3 wt% 첨가할 경우 가장 낮은 손실과 높은 공명주파수를 나타내었다.

• 한국세라믹학회지
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• 제30권5호
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• pp.397-403
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• 1993

Widely used dielectrics, barium titanate was promising material for ceramic capacitor. It was produced by specific formulation with various dopants-La2O3, ZrO2, SnO2, CaZrO3, CaTiO3, CaSnO3, Bi2O3, and etc.-according to demanded properties of capacitor. In this study, we would examinate the study of dielectric properties and temperatuer characteristics (T.C.) with the amount of Bi2O3. The sample was prepared with [BaTiO3]10＋[BaZrO3, SnO2, La2O3, ZrO2]10 and Bi2O3 varied from 1.0, 1.5, 2.0, 2.5 to 3.0wt%. After milling and mixing for 15hrs, each sample was dried and then pressed at 700kg/$\textrm{cm}^2$ into pellets. Pellets were fired at 131$0^{\circ}C$, for 3hrs in air. As the result of measurements, dielectric constant, break down voltage, and insulation resistance were increased with the amount of Bi2O3, and the resonant frequency was shifted from high frequency to low frequency range. In the case of temperature characteristics, capacitance change rate was symmetrically changed at -$25^{\circ}C$ and ＋85$^{\circ}C$ respectively. Therefore, it is recognized that the temperature characteristics can be moderated with doping Bi2O3 in our study.

• The Korean Journal of Ceramics
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• 제4권2호
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• pp.83-89
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• 1998

The structure refinements and the electrical and magnetoelectric measurements were performed for BIT.1BF and BIT.2BT. The tetragonal distortion of the ab plane became lessened with the addition of $4BiFeO_3 into Bi_4Ti_3O_{12}$ significantly. However, the tilting of the outer-oxygen octahedra of the perovskite unit and the elongatin of the $(Bi_2O_2)^{2+}$ layers became more pronounced. For the both phases, the bariations of dielectric properties and electrical conductivities at high temperatures showed that the ferroelectic I-rerroelectric II phase transition existed before reaching the Curie temperature. The electrical conductivity became higher with the increase of $Fe^{3+}$ ions, implying that the electron transfer increased correspondingly. The magnetoelectric effect was observed linear up to ~8 kOe, which was stronger in BIT.1BF than BIT.2BF. This behavior indicates that the distortion of the ab plane may affect the induced polarization as well as magnetic moment.

• 한국재료학회지
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• 제21권10호
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• pp.563-567
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• 2011

We report the structural characterization of $Bi_xZn_{1-x}O$ thin films grown on c-plane sapphire substrates by plasma-assisted molecular beam epitaxy. By increasing the Bi flux during the growth process, $Bi_xZn_{1-x}O$ thin films with various Bi contents (x = 0~13.17 atomic %) were prepared. X-ray diffraction (XRD) measurements revealed the formation of Bi-oxide phase in (Bi)ZnO after increasing the Bi content. However, it was impossible to determine whether the formed Bi-oxide phase was the monoclinic structure ${\alpha}-Bi_2O_3$ or the tetragonal structure ${\beta}-Bi_2O_3$ by means of XRD ${\theta}-2{\theta}$ measurements, as the observed diffraction peaks of the $2{\theta}$ value at ~28 were very close to reflection of the (012) plane for the monoclinic structure ${\alpha}-Bi_2O_3$ at 28.064 and the reflection of the (201) plane for the tetragonal structure ${\beta}-Bi_2O_3$ at 27.946. By means of transmission electron microscopy (TEM) using a diffraction pattern analysis and a high-resolution lattice image, it was finally determined as the monoclinic structure ${\alpha}-Bi_2O_3$ phase. To investigate the distribution of the Bi and Bi-oxide phases in BiZnO films, elemental mapping using energy dispersive spectroscopy equipped with TEM was performed. Considering both the XRD and the elemental mapping results, it was concluded that hexagonal-structure wurtzite $Bi_xZn_{1-x}O$ thin films were grown at a low Bi content (x = ~2.37 atomic %) without the formation of ${\alpha}-Bi_2O_3$. However, the increased Bi content (x = 4.63~13.17 atomic %) resulted in the formation of the ${\alpha}-Bi_2O_3$ phase in the wurtzite (Bi)ZnO matrix.

• 전기화학회지
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• 제8권1호
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• pp.17-23
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• 2005

$Bi_2O_3$를 첨가한 8M KOH용액에서 다결정 Ag전극의 전기화학적인 거동과 생성된 산화물들의 미세조직 변화를 분석하였다. $Bi_2O_3$를 첨가한 8M KOH용액에서 Ag 산화물뿐만 아니라 새로운 Ag-Bi-O화합물들이 생성되는 것을 알 수 있었다. Ag(I) 산화물 생성 전위 영역에서는 $Ag_2O$ 이외에, Ag-Bi-O 화합물이 핵 생성과 3D성장 과정에 의해서 생성되고, Ag(II)산화물 생성 전위 영역에서는 AgO뿐만 아니라 새로운 Ag-Bi-O화합물들이 핵 생성과 3D성장 과정에 의해서 생성되었다. Ag(I) 산화물 생성 전위에서 두 가지 형상의 Ag(I) 산화물이 생성되는 것을 SEM 조직에 의해 관찰하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
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• pp.200-201
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• 2007

The SBT($SrBi_2Ta_2O_9$) thin films with $Bi_2O_3$ buffer layer were deposited on Pt/Ti/$SiO_2$/Si substrate by R.F. magnetron sputtering method in order to improve the ferroelectric characteristics. In SBT thin films, the deficiency of bismuth during the process due to its volatility results in an obvious non stoichiometry of the films and the presence of secondary phases. $Bi_2O_3$ buffer layer was found to be effective to achieve the low temperature crystallization and improve the ferroelectric properties of SBT thin films. Ferroelectric properties and crystallinities of SBT thin films with various post annealing of $Bi_2O_3$ buffer layer were observed as various annealing temperature, using X-Ray Diffraction (XRD), scanning electron microscopy (SEM), Keithley 237 and HP 4192A Impedance Analyzer.

• Progress in Superconductivity
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• 제4권2호
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• pp.148-152
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• 2003

We have observed the temperature dependences of Bi $L_{III}$ edge spectra by extended X-ray absorption spectroscopy for a high quality single crystal and a powder of the $Ba_{0.6}K_{0.4}BiO_3$ superconductor. $Ba_{0.6}K_{0.4}BiO_3$ has the cubic structure and metallic states. The deformation of the $BiO_{6}$ octahedra, which is due to the anomalies of the Bi-O and Bi-Ba bond length, was showed by the double-shell fit. It was clearly found that these anomalies are owing to the difference in the strength of Bi-O bonds. The temperature dependences of both bond lengths and the Debye-Walter factor ${\sigma}^2$ of the Bi-O and Bi-(Ba,K) bond are discussed to illustrate local structural features of the $Ba_{0.6}K_{0.4}BiO_3$