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http://dx.doi.org/10.5762/KAIS.2010.11.10.3853

Analysis of Electrical Characteristics of Silicon Solar cell according to the ARC thickness using Medici Program  

Kim, Jae-Gyu (Department of Nano Eng., Inje University)
Kim, Ji-Man (Department of Nano Systems Eng., Center for Nano Manufacturing)
Song, Han-Jung (Department of Nano Eng., Inje University)
Publication Information
Journal of the Korea Academia-Industrial cooperation Society / v.11, no.10, 2010 , pp. 3853-3858 More about this Journal
Abstract
This paper shows electrical analysis of the silicon solar cell according to the various ARC thickness using Medici program. we built a mesh structure of the solar cell that use ARC consisting of ITO(Indium-Tin-Oxide) transparent electrode, for the Medici modeling. About various oxide layer thickness of the ARC for 30 nm, 60 nm, 90 nm, changes of the I-V curve, Isc, Voc, transmittance and external collection efficiency performed according to wavelength of Incident ray. Simulation results show maximum power 22 mW/$cm^2$, fill factor 0.83 in condition of 60 nm ITO thickness.
Keywords
ARC; Wavelength; Medici; transmittance; External collection efficiency;
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  • Reference
1 A.I. Stoller, The Etching of Deep Vertical Walled Pattern in Silicon (RCA Review, June 1970)
2 O.B. Lee, J. Appl. Phys, 1969, p.40.
3 윤재호,김동호,권정대,임동찬, "박막형 태양전지 소재 기술", 녹색 소재 기술 특집 21권, 2009, pp.77
4 이재형, 임동건, 이준신,, "태양전지 원론", 홍릉 과학출판사,2005,pp.104-116
5 이병인,류태규,한정만,최규하, "Preparation and Characterization of Transparent Conductive ITO Films by MOD Procss" 추계전력전자학술대회 논문집, 1998, pp.385-387