1 |
D. J. Gundlach, Y. Y. Lin, T. N. Jackson, S. F. Nelson and D. G. Schlom, IEEE ELECTRON DEVICE LETTERS 18, 87 (1997)
DOI
ScienceOn
|
2 |
P. Masri, Surface science reports 48, 1 (2002)
DOI
ScienceOn
|
3 |
J. G. Simmons, Physial Review 155, 657 (1967)
DOI
|
4 |
P. W. May, S. Hohn, W. N, Wang and N. A. Fox, Appl. Phys. Lett. 27, 2182 (1998)
|
5 |
Giulia Galli and Richard M. Martin, Phys. Rev. Lett. 62, 555 (1989)
DOI
ScienceOn
|
6 |
P. R. Emtage and W. Tantraporn, Phys. Rev. Lett. 8, 267 (1962)
DOI
|
7 |
M. J. Kellicutt, I. S. Suzuki, C. R. Burr, M. Suzuki, M. Ohashi and M. S. Whittingham, Physical Review B47, 13664 (1993)
|
8 |
J. R. Kalnin and E. Kotomin, J. Phys. A:Math. Gen. 31, 7227 (1998)
DOI
ScienceOn
|
9 |
Seung Youb Lee, Heon Ryu, Jun Yong Hong, Min Hyeng Yeom, Ji Hoon Yang, Woo Chel Choi, Myeng Hoi Kwon and Chong Yun Park, J. Kor. Vac. Soc. 16, 291 (2007)
과학기술학회마을
DOI
ScienceOn
|
10 |
Ioannis Kymissis, C. D. Dimitrakopoulos and Sampath Purushothaman, IEEE TRANSACTIONS ON ELECTRON DEVICES 48, 1060 (2001)
DOI
ScienceOn
|
11 |
T. Oh, IEEE transactions on Nanotechnology 5, 23 (2006)
DOI
ScienceOn
|
12 |
A. Grill and D. A. Neumayer, J. Appl. Phys. 94, 6697 (2003)
DOI
ScienceOn
|
13 |
J. Frenkel, Phys. Rev. 54, 647 (1938)
DOI
|
14 |
Jin Yong Kim, Moo Sung Hwang, Yoon-Hae Kim, and Hyeong Joon Kim, Young Lee, J. Appl. Phys. 90, 2469 (2001)
DOI
ScienceOn
|
15 |
Soo In Kim, Chang Woo Lee, J. Kor. Vac. Soc. 16, 348 (2007)
과학기술학회마을
DOI
ScienceOn
|