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http://dx.doi.org/10.3807/KJOP.2013.24.3.143

Wide Field Imaging Analysis of Graphene  

Kwon, Kanghyuk (MMS New Equipment Development Team, SAMSUNG TECHWIN)
Kim, Nayoung (MMS New Business Team, SAMSUNG TECHWIN)
Havener, Robin W. (Department of Applied and Engineering Physics, Cornell University)
Won, Donggwan (MMS New Business Team, SAMSUNG TECHWIN)
Cho, Seungmin (MMS New Business Team, SAMSUNG TECHWIN)
Park, Jiwoong (Department of Chemistry and Chemical Biology, Cornell University)
Publication Information
Korean Journal of Optics and Photonics / v.24, no.3, 2013 , pp. 143-147 More about this Journal
Abstract
A Raman spectrometer is essential for analyzing the characteristics of graphene. The commercial micro-Raman spectrometer is useful for measuring small areas, but due to the small measuring area, it has limited use in industry, as a sampling measure. This paper suggests a Raman spectrometer able to get a large area image of graphene. By using this image, we can get information on defects and on the presence of graphene. Therefore, this equipment can be used for quality assessment for production of graphene.
Keywords
Wide-field imaging of graphene; Raman spectrometry; Graphene imaging;
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