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http://dx.doi.org/10.3807/KJOP.2004.15.6.539

Low Coherence Interferometer for Measurement of Path Length Errors in Arrayed-Waveguide Grating  

Song, Young-Ki (School of Electronics Engineering Department of Electronics and Communications Engineering)
Heo, Nam-Chun (School of Electronics Engineering Department of Electronics and Communications Engineering)
Chung, Young-Chul (School of Electronics Engineering Department of Electronics and Communications Engineering)
Publication Information
Korean Journal of Optics and Photonics / v.15, no.6, 2004 , pp. 539-546 More about this Journal
Abstract
An improved low coherence interferometer system and a new analysis method for the accurate measurement of the optical path difference error of an AWG (Arrayed-Waveguide Grating) are described. The use of software simplifies the experimental setup by eliminating the hardware (clock generator). In addition, the actual distances between the peak positions of the adjacent interference signals are calculated using interpolation methods. The wavelength transmission characteristics of the AWG are calculated assuming the measured phase errors. The calculated AWG characteristic is quite similar to the actual measurement result, confirming accuracy of the proposed measurement setup.
Keywords
AWG; Low Coherence; Interferometer; Optical Path Error;
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