1 |
Lim, S. P. S., Siow, L. Y., Chai, T. C., Rao, V. S., Takeda, K., et al., "Challenges and Approaches of Ultra-Fine Pitch Cu Pillar Assembly on Organic Substrate using Wafer Level Underfill," Proc. of IEEE 15th EPTC, pp. 538-542, 2013.
|
2 |
Zhan, C.-J., Chuang, C.-C., Juang, J.-Y., Lu, S.-T., and Chang, T.-C., "Assembly and Reliability Characterization of 3D Chip Stacking with 30 Pitch Lead-Free Solder Micro Bump Interconnection," Proc. of 60th ECTC, pp. 1043-1049, 2010.
|
3 |
Gerber, M., Beddingfield, C., O'Connor, S., Min, Y., MinJae, L., and et al., "Next Generation Fine Pitch Cu Pillar Technology-Enabling Next Generation Silicon Nodes," Proc. of 61th ECTC, pp. 612-618, 2011.
|
4 |
Lin, Y. M., Zhan, C. J., Juang, J. Y., Lau, J. H., Chen, T. H., et al., "Electromigration in Ni/Sn Intermetallic Micro Bump Joint for 3D IC Chip Stacking," Proc. of 61th ECTC, pp. 351-357, 2011.
|
5 |
Lee, M., Yoo, M., Cho, J., Lee, S., Kim, J., et al., "Study of Interconnection Process for Fine Pitch Flip Chip," Proc. of 59th ECTC, pp. 720-723, 2009.
|
6 |
Bigas, M. and Cabruja, E., "Characterisation of electroplated Sn/Ag solder bumps," Microelectronics Journal, Vol. 37, No. 4, pp. 308-316, 2006.
DOI
ScienceOn
|
7 |
Zhao, Q., Hu, A., Li, M., and Sun, J., "Effect of Electroplating Layer Structure on Shear Property and Microstructure of Multilayer Electroplated Sn-3.5 Ag Solder Bumps," Microelectronics Reliability, Vol. 53, No. 2, pp. 321-326, 2013.
DOI
|
8 |
Tsai, C. G., Hsieh, C. M., and Yeh, J. A., "Self-Alignment of Microchips using Surface Tension and Solid Edge," Sensors and Actuators A: Physical, Vol. 139, No. 1, pp. 343-349, 2007.
DOI
|
9 |
Toriyama, K., "Challenges for Micro-bump Interconnection Technologies," Proc. of 11th International Symposium on Microelectronics and Packaging, pp. 253-257, 2012.
|
10 |
Yole development "3D IC & TSV Technology," 2011.
|
11 |
Jinhua, Y., Anand, A., Mui, Y., Srinivasan, P., and Master, R., "Reliability Study on Copper Pillar Bumping with Lead Free Solder," Proc. of 9th EPTC, pp. 618-622, 2007.
|
12 |
Orii, Y., Toriyama, K., Noma, H., Oyama, Y., Nishiwaki, H., et al., "Ultrafine-pitch C2 Flip Chip Interconnections with Solder-Capped Cu Pillar Bumps," Proc. of 59th ECTC, pp. 948-953, 2009.
|