Browse > Article
http://dx.doi.org/10.4313/JKEM.2021.34.6.11

Characterization of [011] Poled Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Single Crystals by Resonance Method  

Je, Yub (Maritime Technology Research Institute, Agency for Defense Development)
Sim, Min Seop (Maritime Technology Research Institute, Agency for Defense Development)
Cho, Yohan (Maritime Technology Research Institute, Agency for Defense Development)
Lee, Wonok (IBULE PHOTONICS)
Lee, Sanggoo (IBULE PHOTONICS)
Lee, Jeong Min (Maritime Technology Research Institute, Agency for Defense Development)
Seo, Hee Seon (Maritime Technology Research Institute, Agency for Defense Development)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.34, no.6, 2021 , pp. 466-474 More about this Journal
Abstract
[011] poled ternary Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (PIN-PMN-PT) single crystals have been investigated for active materials for acoustic transducers because of their high piezoelectric properties in both shear and transverse modes. In order to use [011] poled PIN-PMN-PT single crystals for acoustic transducers, the characterization of full-matrix material properties is required. In this study, full sets of compliance, dielectric, and piezoelectric constants of [011] poled rhombohedral PIN-PMN-PT were measured by a resonance method. Dimensions and geometries of 12 samples were proposed for measuring 17 independent material constants of [011] poled rhombohedral PIN-PMN-PT single crystals. Two sets of samples with different PT concentrations, 0.24PIN-0.49PMN-0.27PT and 0.24PIN-0.46PMN-0.30PT, were fabricated and their material properties were measured. Measured impedance spectra and simulated impedance spectra of the samples were compared to check the accuracy of the measurements.
Keywords
Piezoelectric materials; Single crystals; PIN-PMN-PT; Resonant method;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 J. Luo, W. Hackenberger, S. Zhang, and T. R. Shrout, Proc. 2009 IEEE International Ultrasonics Symposium (IEEE, Rome, Italy, 2009) p. 968. [DOI: https://doi.org/10.1109/ULTSYM.2009.5441884]   DOI
2 K. K. Rajan, M. Shanthi, W. S. Chang, J. Jin, and L. C. Lim, Sens. Actuators, A, 133, 110 (2007). [DOI: https://doi.org/10.1016/j.sna.2006.03.036]   DOI
3 S. H. Lee, S. S. Lee, Y. Roh, H. Y. Lee, and J. H. Han, J. Korean Inst. Electr. Electron. Mater. Eng., 17, 31 (2004). [DOI: https://doi.org/10.4313/JKEM.2004.17.1.031]   DOI
4 J. L. Butler and C. H. Sherman, Transducers and Arrays for Underwater Sound, 2nd Ed. (Springer, Switzerland, 2016) p. 643.
5 S. Zhang and F. Li, J. Appl. Phys., 111, 031301 (2012). [DOI: https://doi.org/10.1063/1.3679521]   DOI
6 S. Zhang, F. Li, J. Luo, R. Sahul, and T. R. Shrout, IEEE Trans. Ultrason. Eng., 60, 1572 (2013). [DOI: https://doi.org/10.1109/TUFFC.2013.2737]   DOI
7 IEEE Standard on Piezoelectricity, ANS/IEEE Std No.176 (1987)
8 Y. Zhang, D. Liu, Q. Zhang, W. Wang, B. Ren, X. Zhao, and H. Luo, J. Electron. Mater., 40, 92 (2011). [DOI: https://doi.org/10.1007/s11664-010-1390-2]   DOI
9 S. Zhang, W. Jiang, R. J. Meyer, F. Li, J. Luo, and W. Cao, J. Appl. Phys., 110, 064106 (2011). [DOI: https://doi.org/10.1063/1.3638691]   DOI
10 F. Li, S. Zhang, D. Lin, J. Luo, Z. Xu, X. Wei, and T. R. Shrout, J. Appl. Phys., 109, 014108 (2011). [DOI: https://doi.org/10.1063/1.3530617]   DOI
11 M. J. Zipparo and C. G. Oakley, Proc. 2001 IEEE Ultrasonics Symposium. Proceedings. An International Symposium (Cat. No.01CH37263) (IEEE, Atlanta, USA, 2001). [DOI: https://doi.org/10.1109/ULTSYM.2001.991892]   DOI
12 Standard Definitions and Methods of Measurement for Piezoelectric Vibrators, ANS/IEEE Std No.177 (1966).
13 L. M. Ewart, E. A. McLaughlin, H. C. Robinson, J. J. Stace, and A. Amin, IEEE Trans. Ultrason. Eng., 54, 2469 (2007). [DOI: https://doi.org/10.1109/TUFFC.2007.561]   DOI
14 S. Zhang, F. Li, F. Yu, X. Jiang, H. Y. Lee, J. Luo, and T. R. Shrout, J. Korean Ceram. Soc., 55, 419 (2018). [DOI: https://doi.org/10.4191/kcers.2018.55.5.12]   DOI
15 S. Zhang and F. Li, J. Appl. Phys., 111, 031301 (2012). [DOI: https://doi.org/10.1036/1.3679521]   DOI
16 X. Liu, S. Zhang, J. Luo, T. R. Shrout, and W. Cao, J. Appl. Phys., 106, 074112 (2009). [DOI: https://doi.org/10.1063/1.3243169]   DOI
17 E. Sun, S. Zhang, J. Luo, T. R. Shrout, and W. Cao, Appl. Phys. Lett., 97, 032902 (2010). [DOI: https://doi.org/10.1063/1.3466906]   DOI
18 S. Zhang and L. C. Lim, AIP Adv., 8, 115010 (2018). [DOI: https://doi.org/10.1063/1.5064418]   DOI