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http://dx.doi.org/10.4313/JKEM.2021.34.5.301

Practical Guide to the Characterization of Piezoelectric Properties  

Kang, Woo-Seok (Department of Materials Science and Engineering & Julich-UNIST Joint Leading Institute for Advanced Energy Research (JULIA), Ulsan National Institute of Science and Technology (UNIST))
Lee, Geon-Ju (Department of Materials Science and Engineering & Julich-UNIST Joint Leading Institute for Advanced Energy Research (JULIA), Ulsan National Institute of Science and Technology (UNIST))
Jo, Wook (Department of Materials Science and Engineering & Julich-UNIST Joint Leading Institute for Advanced Energy Research (JULIA), Ulsan National Institute of Science and Technology (UNIST))
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.34, no.5, 2021 , pp. 301-313 More about this Journal
Abstract
Theoretical background for the meaning of various piezoelectric properties can be easily found in a number of textbooks and academic papers. In contrast, how they are actually measured and characterized are rarely described, though this information would be the most important especially to the researchers who just started working on the field. It follows that this report was intended to provide a practical guidance for measuring basic but essential properties of ferroelectric-based piezoelectric materials. The discussion begins with how to measurement dielectric properties such as dielectric permittivity and loss (dissipation factor), followed by piezoelectric properties such as piezoelectric constants, electromechanical coupling factor, and quality factor as well as ferroelectric features, i.e., electric field dependent polarization hysteresis. Though our discussion here is limited to the techniques that are already well-standardized, it is expected to make a seed to be developed into more challenging and creative ones.
Keywords
Dielectric properties; Piezoelectric properties; Ferroelectric properties;
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1 J. Fialka and P. Benes, Proc. 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings (IEEE, Graz, Austria, 2012). [DOI: https://doi.org/10.1109/i2mtc.2012.6229293]   DOI
2 H. J. Lee, S. Zhang, J. Luo, F. Li, and T. R. Shrout, Adv. Funct. Mater., 20, 3154 (2010). [DOI: https://doi.org/10.1002/adfm.201000390]   DOI
3 C. B. Sawyer and C. H. Tower, Phys. Rev., 35, 269 (1930). [DOI: https://doi.org/10.1103/PhysRev.35.269]   DOI
4 F. Li, S. Zhang, Z. Xu, X. Wei, J. Luo, and T. R. Shrout, J. Appl. Phys., 108, 034106 (2010). [DOI: https://doi.org/10.1063/1.3466978]   DOI
5 W. S. Kang, T. G. Lee, J. H. Kang, J. H. Lee, G. Choi, S. W. Kim, S. Nahm, and W. Jo, J. Eur. Ceram. Soc., 41, 2482 (2021). [DOI: https://doi.org/10.1016/j.jeurceramsoc.2020.12.028]   DOI
6 C. H. Hong and W. Jo, J. Am. Ceram. Soc., 101, 1949 (2018). [DOI: https://doi.org/10.1111/jace.15344]   DOI
7 C. H. Hong, Z. Fan, X. Tan, W. S. Kang, C. W. Ahn, Y. Shin, and W. Jo, J. Eur. Ceram. Soc., 38, 5375 (2018). [DOI: https://doi.org/10.1016/j.jeurceramsoc.2018.08.006]   DOI
8 S. S. Lee, C. H. Lee, T. A. Duong, H.T.K. Nguyen, H. S. Han, and J. S. Lee, J. Korean Inst. Electr. Electron. Mater. Eng., 34, 1 (2021). [DOI: https://doi.org/10.4313/JKEM.2021.34.1.1]   DOI
9 T. M. Noh, J. S. Kim, J. S. Ryu, and H. S. Lee, J. Korean Ceram. Soc., 48, 323 (2011). [DOI: https://doi.org/10.4191/kcers.2011.48.4.323]   DOI
10 J. S. Lee, E. C. Shin, D. K. Shin, Y. Kim, P. A. Ahn, H. H. Seo, J. M. Jo, J. H. Kim, G. R. Kim, Y. H. Kim, J. Y. Park, C. H. Kim, J. O. Hong, and K. H. Hur, J. Korean Ceram. Soc., 49, 475 (2012). [DOI: https://doi.org/10.4191/kcers.2012.49.5.475]   DOI
11 S. Zhang, F. Li, F. Yu, X. Jiang, H. Y. Lee, J. Luo, and T. R. Shrout, J. Korean Ceram. Soc., 55, 419 (2018). [DOI: https://doi.org/10.4191/kcers.2018.55.5.12]   DOI
12 H. Y. Lee, Proc. ISAF-ICE-EMF-IWPM-PFM Meeting 2019EPFL (Lausanne, Switzerland, 2019).
13 B. Jaffe, W. R. Cook, JR, and H. Jaffe, Piezoelectric Ceramics (Academic Press, New York, 1971), p. 290.
14 A. Kumar, J. Y. Yoon, A. Thakre, M. Peddigari, D. Y. Jeong, Y. M. Kong, and J. Ryu, J. Korean Ceram. Soc., 56, 412 (2019). [DOI: https://doi.org/10.4191/kcers.2019.56.4.10]   DOI
15 H. J. Lee, S. Zhang, and T. R. Shrout, J. Appl. Phys., 107, 124107 (2010). [DOI: https://doi.org/10.1063/1.3437068]   DOI
16 J. R. Yoon, H. Moon, and H. Y. Lee, J. Korean Inst. Electr. Electron. Mater. Eng., 23, 216 (2010). [DOI: https://doi.org/10.4313/JKEM.2010.23.3.216]   DOI
17 C. H. Hong, H. P. Kim, B. Y. Choi, H. S. Han, J. S. Son, C. W. Ahn, and W. Jo, J. Materiomics, 2, 1 (2016). [DOI: https://doi.org/10.1016/j.jmat.2015.12.002]   DOI
18 H. P. Kim, G. J. Lee, H. Y. Jeong, J. H. Jang, G. Y. Kim, S. Y. Choi, H. Y. Lee, S. G. Lee, and W. Jo, J. Eur. Ceram. Soc., 39, 3327 (2019). [DOI: https://doi.org/10.1016/j.jeurceramsoc. 2019.04.022]   DOI