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Simulated Images of the Second Derivative of the Exit-plane Wavefunction Giving Sub-50 pm Resolutions in HRTEM  

Kim, Hwang-Su (Department of Physics, Kyungsung University)
Publication Information
Applied Microscopy / v.39, no.2, 2009 , pp. 175-183 More about this Journal
Abstract
In this paper we present sub-50 pm resolution images of atom columns simulated with the negative of the second derivative of the exit-plane wave function (EPW). The EPW can be retrieved from a focal series reconstruction in the (high resolution) transmission electron microscopy (HRTEM). The simulated images are for Si and InAs in [114] and [116] orientations, which give about sub-50 pm separations of atom columns. The theoretical reason for the validity of this method is given from analysis based on the kinematical diffraction theory, and the limitation for applicability of this method also is discussed.
Keywords
Exit-plane wave function; Sub-50 pm HRTEM images;
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