1 |
Hirsch PB, Howie A, Nicholson RB, Pashley DW, Whelan MJ: Electron microscopy of thin crystals, Krieger Publ., Huntington (N.Y.), 1977
|
2 |
Jia CL, Lentzen M, Urban K: High-resolution transmission electron microscopy using negative spherical aberration. Microsc Microanal 10 : 174-184, 2004
DOI
ScienceOn
|
3 |
Kim HS, Sheinin SS: On effects of exit and entrance surface inclination on structure images. Ultramicroscopy 51 : 109-116, 1993
DOI
ScienceOn
|
4 |
Lentzen M: Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction. Micros Microanal 12 : 191-205, 2006
DOI
ScienceOn
|
5 |
Self PG, O'Keefe MA, Buseck PR, Spargo AEC: practical computation of amplitudes and phases in electron diffraction. Ultramicroscopy 11 : 35-52, 1983
DOI
ScienceOn
|
6 |
Spence JCH: Experimental high resolution electron microscopy. Oxford Univ Press, Oxford, 1981
|
7 |
Coene W, Janssen G, Op de Beeck M, Van Dyck D: Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy. Phys Rev Lett 69 : 3743-3746, 1992
DOI
ScienceOn
|
8 |
O'Keefe MA: Seeing atoms with aberration-corrected sub-ngstrom electron microscopy. Ultramicroscopy 108 : 196-209, 2008
DOI
ScienceOn
|
9 |
Cowley JM, Moodie AF: Fourier images IV : The phase grating. Proc Phys Soc76 : 378-384, 1960
DOI
ScienceOn
|
10 |
O'Keefe MA, Allard LF, Blom DA. Tackling the size problem: seeing atoms smaller for better TEM resolution. Microsc Microanal 13 : 872-873, 2007
|
11 |
Coene WMJ, Thust A, Op de Beeck M, Van Dyck D: Maximumlikelihood method for focus-variation image reconstruction in high resolution transmission microscopy. Ultramicroscopy 64 : 109-135, 1996
DOI
ScienceOn
|
12 |
Tillmann K, Thust A, Urban K: Spherical aberration correction in tandem with exit-plane wave function reconstruction: interlocking tools for the atomic scale imaging of lattice defects in GaAs. Micros Microanal 10 : 185-198, 2004
DOI
ScienceOn
|
13 |
Allen LJ, Oxley MP, Ishizuka K: Electron microscope Cs correction using iterative wave-function reconstruction. Microscopy and Analysis 52 : 5-7, 2006
|
14 |
Allen LJ, McBride W, O'Leary NL, Oxley MP: Exit wave reconstruction at atomic resolution. Ultramicroscopy 100 : 91-104, 2004
DOI
ScienceOn
|
15 |
Kisielowski C, Freitag B, Bischoff M, van Lin H, Lazar S, Knippels G, Tiemeijer P, van der Stam M, von Harrach S, Stekelenburg M, Haider M, Uhlemann S, Müller H, Hartel P, Kabius B, Miller D, Petrov I, Olson EA, Donchev T, Kenik EA, Lupini AR, Bentley J, Pennycook SJ, Anderson IM, Minor AM, Schmid AK, Duden T, Radmilovic V, Ramasse QM, Watanabe M, Erni R, Stach EA, Denes P, Dahmen U: Detector of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5- information limit. Microsc Microanal 14 : 469-477, 2008
DOI
ScienceOn
|