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http://dx.doi.org/10.5229/JKES.2002.5.3.153

Effects of Leveler on the Trench Filling during Damascene Copper Plating  

Lee, Yu-Young (Eco-Nano Research Center, Korea Institute of Science and Technology, School of Metallurgy & Materials Engineering, Kookmin University)
Park, Young-Joon (Nano Device Research Center, Korea Institute of Science and Technology, School of Metallurgy & Materials Engineering, Kookmin University)
Lee, Jae-Bong (School of Metallurgy & Materials Engineering, Kookmin University)
Cho, Byung-Won (Eco-Nano Research Center, Korea Institute of Science and Technology)
Publication Information
Journal of the Korean Electrochemical Society / v.5, no.3, 2002 , pp. 153-158 More about this Journal
Abstract
The effects of leveler on the copper trench filling were investigated during damascene plating process. To investigate the trench filling effect with the addition of a leveler, a cross-section images of the electroplated trenches with the width of$0.37{\mu}m,\;and\;0.18{\mu}m$ were observed by field emission scanning electron microscope (FE-SEM). Polyethylene glycol(PEG), 3-mercapto-1-propanesulfonic acid and Janus Green B were used as a carrier, an accelerator and a leveler. $0.37{\mu}m$ trenches were superfilled without voids, but there was voids formation in $0.18{\mu}m$ trenches when the leveler was not added into the electrolyte. On the other hand $0.18{\mu}m$ trenches were superfilled without voids with the addition of the leveler due to the reduction growth rate of copper at protrusions and edges, which yield smooth final deposit surface. The leverer effect becomes more significant as the width of trenches becomes smaller when trenches are filed.
Keywords
electroplating; leveler; damascene; void; superfilling;
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