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http://dx.doi.org/10.7471/ikeee.2018.22.2.510

Enhancement Technologies of Signal-to-Noise Ratio in the Near-Field Scanning Systems  

Shin, Youngsan (School of Electronic Engineering and Research Institute of Future Automobile, Soongsil University)
Lee, Seongsoo (School of Electronic Engineering and Research Institute of Future Automobile, Soongsil University)
Publication Information
Journal of IKEEE / v.22, no.2, 2018 , pp. 510-513 More about this Journal
Abstract
Recently, EMC (electromagnetic compatibility) becomes very important, which demands the measurement of EMI (electromagnetic interference) in the chip level. NFS (near-field scanning) systems defined in IEC 61967 and IEC 62508 are typical methods to analyze EMI in the chip level. As chips becomes faster, frequency measurement of NFS system should become wideband, but it degrades SNR (singal-to-noise ratio) of the NFP (near-field probe). This paper surveys SNR enhancement technologies of the NFS while maintaining wideband characteristics.
Keywords
EMC; EMI; NFS; NFP; IEC 61967; IEC 62508;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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