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Generating Reduced Test Model of Embedded Software using Partial Order Techniques  

이남희 (한국과학기술원 전자전산학과)
차성덕 (한국과학기술원 전자전산학과)
Abstract
In [1] we proposed a method to generate a test model (GFSM) from a set of scenarios of embedded software. Each scenario describes the interaction sequences for an external input event. Although these external events are generated and accepted alternatively and concurrently by embedded software, we considered only the alternative relations. In this paper, we describe an improved algorithm to generate GFSM from concurrent scenarios, and propose methods to reduce the number of transitions in the GFSM. The first is the synchronous interpretation of message passing instead of asynchronous one considering the real behavior of tasks in embedded software. The others apply the partial order techniques to the GFSM using independent regions. We apply the method to generate a reduced GFSM of embedded software running on a digital TV.
Keywords
Partial order method; embedded software testing; Message Sequence Charts;
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Times Cited By KSCI : 1  (Citation Analysis)
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