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Implementation of EEG Artifact Removal Process Based on Bispectrum Analysis  

Park, Junmo (School of Electronic and Biomedical Engineering, Tongmyong University)
Publication Information
Journal of the Institute of Convergence Signal Processing / v.20, no.2, 2019 , pp. 63-69 More about this Journal
Abstract
In this study, bispectrum analysis method introduced to reduce variability of SEF(spectral edge frequency) and MF(median frequency), which are the anesthetic depth indexes extracted by EEG spectral analysis. Bispectrum analysis is an analytical method that can confirm the nonlinearity of EEG. Signal measurement and analysis in the surgical environment should take into consideration various external artifact factors. Bispectrum analysis can confirm the presence of externally introduced artifacts, thereby effectively eliminating artifacts that affect the EEG signal. By applying bispectrum parameters, real-time variability of the anesthetic depth parameters SEF, MF could be reduced. Elimination of variability makes it possible to use SEF, MF as a real-time index during surgery.
Keywords
Anesthetic depth; EEG; Bispectrum; SEF; MF;
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