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http://dx.doi.org/10.3740/MRSK.2006.16.7.455

Defect Analysis of Gd2O2S : Tb Using Coincidence Doppler Broadening Positron Annihilation Spectroscopy  

Lee, C.Y. (Department of Physics, Hannam University)
Bae, S.H. (Department of Radiology, Konyang University Hospital)
Kim, J.H. (Radiopharmaceuticals Lab, KIRAMS)
Kwon, J.H. (Nuclear Materials Technology Division, KAERI)
Publication Information
Korean Journal of Materials Research / v.16, no.7, 2006 , pp. 455-459 More about this Journal
Abstract
Coincidence Doppler Broadening (CDB) of positron annihilation spectroscopy was applied to analyze defects in the chemical state of Department of Physics, $Gd_2O_2S$:Tb intensifying screens. The screen samples were irradiated by 80 MV X-rays in hospital and were used for 0, 2, 4, and 6 years respectively. There was a positive relationship between the S-parameter values and time of exposure to X-rays. Most of the defects were indicated to have been generated by X-rays. A 1D CDB was developed in order to reduce the background noise, and the S-parameter values of the $Gd_2O_2S$:Tb intensifying screens, using the 1D CDB, varied between 0.4974 and 0.4991.
Keywords
Coincidence; Positron; $Gd_2O_2S$:Tb; defect; S-parameter;
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