Steganalysis Using Histogram Characteristic and Statistical Moments of Wavelet Subbands |
Hyun, Seung-Hwa
(School of Electronics Eng., Pusan National University)
Park, Tae-Hee (Dept. Mechatronics Eng., TongMyong University) Kim, Young-In (Dept. Biomedical Eng., Pusan National University) Kim, Yoo-Shin (School of Electronics Eng., Pusan National University) Eom, Il-Kyu (School of Electronics Eng., Pusan National University) |
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