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http://dx.doi.org/10.5370/KIEE.2010.59.7.1340

The Cause Analysis and Reduction Method of the FRC Noise Through a New Approach in TFT-LCD  

Hwang, Jong-Hee (연세대학교 전기전자공학과, LG 디스플레이 선행개발)
Kim, Hye-Jin (LG 디스플레이 선행개발)
Choe, Yoon-Sik (연세대학교 전기전자공학과)
Publication Information
The Transactions of The Korean Institute of Electrical Engineers / v.59, no.7, 2010 , pp. 1340-1345 More about this Journal
Abstract
FRC(Frame Rate Control) has been applied to the monitor and TV product as part of cost-saving in many flat panel display manufacturers. As FRC can represent the same number of gray scale level with bits of a smaller amount than bits of the input image data, it is widely used. However, FRC causes visual artifacts by using repeatedly pre-designed the FRC unit size of block pattern in display devices. Therefore, this paper analyzes the cause of the visual artifacts. And in order to improve them, it proposed the pattern arrangement of FRC unit blocks through frame rolling method as analytic solution for the first time. So, we could embody causes of FRC noise. Using the proposed structure, more robust pattern to FRC noise will be designed.
Keywords
FRC; Color depth; Pattern design; FRC noise; TFT-LCD;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
Times Cited By SCOPUS : 0
연도 인용수 순위
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