1 |
J. S. Kim, Y. C. Oh, C. W. S. Choi, M. J. Song and C. H. Kim, 'Fabrication and Dielectric Properties of SCT Thin Film by RF Sputtering Method', ISEIM June 5-9, pp.600-603, 2005
|
2 |
Dong-Hoe Chung, Joon-Ung Lee, ' Electrical Conduction Mechanism in ITO/Alq3/Al Organic Light-Emitting Diodes', Trans. of KIEEME. vol.86(1), pp.24-28, 2004
|
3 |
SUSUMU NISHIGAKI, KANJI MURANO, and AKIO OHKOSHI, 'Dielectric Properties of Ceramics in the system ( ) and Their Applications in a High-Voltage Capacitor', J. Am. Ceram. Soc., Vol. 65(11), pp. 554-560, 1982
DOI
|
4 |
K. H. Kim, M. J. Keum, 'Thin Film Properties by Facing Targets Sputtering System', Applied Surface Science 169-170, pp.410 - 414, 2001
|
5 |
J. S. Kim, C. N. Cho, C. G. Shin and C. H. Kim, 'Microstructure and Properties of SCT Thin Film by RF Sputtering Method', ICPADM June 1-5, pp.1100 -1103, 2003
|
6 |
Sung-Gap Lee, Young-Hie Lee and Seori-Gi Bae, 'A Study on the Structural and Dielectric Properties of (Ba,Sr,Ca) with Sintering Conditions', J. KIEE, Vol.14(6), pp.460-465, 2001
과학기술학회마을
|
7 |
R. C. Neville and C. A. Mead, 'Tunneling Currents in Zinc Oxide', J. Appl. Phys., Vol.42, pp.5285-5290, 1970
|
8 |
O. Nakagawara, T. Shimuta, T. Makino, S. Arai, H. Tabata and T. Kawai, 'Dependence of dielectric and ferroelectric behaviors on growth orientation in epitaxial superlattices', Vacuum, Vol.66, Issues(3-4), pp.397-401, 2002
DOI
|
9 |
W. Johnson, L. E. Cross, F. A. Hummel, 'Dielectric Relaxation In Strontium Titanates Containing Rare-Earth Lons', J. Appl, Phys., Vol.41, pp.2828-2833, 1970
DOI
|
10 |
J. C. Fisher and I. Glaever, 'Tunneling through thin insulating layers', J. Appl. Phys., Vol.32(2), pp.172, 1961
|