Acknowledgement
이 논문은 정부(과학기술정보통신부)의 재원으로 한국연구재단 혁신성장 선도 고급연구인재 육성사업의 지원을 받아 수행된 연구입니다(No.NRF2021M3H1A104892211).
References
- S. Park, S. Jeong, J. Choi, Y. Kim, and J. Yi, J. Korean Inst. Electr. Electron. Mater. Eng., 36, 49 (2023). doi: https://doi.org/10.4313/JKEM.2023.36.1.8
- H. Park, Y. J. Lee, J. Park, Y. Kim, J. Yi, Y. Lee, S. Kim, C. K. Park, and K. J. Lim, Trans. Electr. Electron. Mater., 19, 165 (2018). doi: https://doi.org/10.1007/s42341-018-0026-8
- C. Han, R. Santbergen, M. van Duffelen, P. Procel, Y. Zhao, G. Yang, X. Zhang, M. Zeman, L. Mazzarella, and O. Isabella, Prog. Photovoltaics: Res. Appl., 30, 750 (2022). doi: https://doi.org/10.1002/pip.3550
- Y. Jiang, T. Feurer, R. Carron, G. T. Sevilla, T. Moser, S. Pisoni, R. Erni, M. D. Rossell, M. Ochoa, R. Hertwig, A. N. Tiwari, and F. Fu, ACS Nano, 14, 7502 (2020). doi: https://doi.org/10.1021/acsnano.0c03265
- L. Antognini, C. Sthioul, J. Dreon, V. Paratte, D. Turkay, L. L. Senaud, C. Ballif, and M. Boccard, Sol. Energy Mater. Sol. Cells, 248, 111975 (2022). doi: https://doi.org/10.1016/j.solmat.2022.111975
- H. Lin, M. Yang, X. Ru, G. Wang, S. Yin, F. Peng, C. Hong, M. Qu, J. Lu, L. Fang, C. Han, P. Procel, O. Isabella, P. Gao, Z. Li, and X. Xu, Nat. Energy, 8, 789 (2023). doi: https://doi.org/10.1038/s41560-023-01255-2
- P. Muralidharan, M. A. Leilaeioun, W. Weigand, Z. C. Holman, S. M. Goodnick, and D. Vasileska, IEEE J. Photovoltaics, 10, 363 (2020). doi: https://doi.org/10.1109/JPHOTOV.2019.2957655
- K. U. Ritzau, M. Bivour, S. Schroer, H. Steinkemper, P. Reinecke, F. Wagner, and M. Hermle, Sol. Energy Mater. Sol. Cells, 131, 9 (2014). doi: https://doi.org/10.1016/j.solmat.2014.06.026
- D. Rached and R. Mostefaoui, Thin Solid Films, 516, 5087 (2008). doi: https://doi.org/10.1016/j.tsf.2008.02.031
- C. Messmer, M. Bivour, C. Luderer, L. Tutsch, J. Schon, and M. Hermle, IEEE J. Photovoltaics, 10, 343 (2020). doi: https://doi.org/10.1109/JPHOTOV.2019.2957672
- N. Ahmad, H. Zhou, P. Fan, and G. Liang, EcoMat, 4, e12156 (2022). doi: https://doi.org/10.1002/eom2.12156
- T. Koida, H. Fujiwara, and M. Kondo, J. Non-Cryst. Solids, 354, 2805 (2008). doi: https://doi.org/10.1016/j.jnoncrysol.2007.09.076
- P.D.C. King, R. L. Lichti, Y. G. Celebi, J. M. Gil, R. C. Vilao, H. V. Alberto, J. Piroto Duarte, D. J. Payne, R. G. Egdell, I. McKenzie, C. F. McConville, S.F.J. Cox, and T. D. Veal, Phys. Rev. B, 80, 081201(R) (2009). doi: https://doi.org/10.1103/PhysRevB.80.081201
- T. Koida, H. Sai, and M. Kondo, Thin Solid Films, 518, 2930 (2010). doi: https://doi.org/10.1016/j.tsf.2009.08.060
- J. Weber, E. V. Lavrov, and F. Herklotz, Phys. B, 407, 1456 (2012). doi: https://doi.org/10.1016/j.physb.2011.09.061
- D. Erfurt, M. D. Heinemann, S. S. Schmidt, S. Korner, B. Szyszka, R. Klenk, and R. Schlatmann, ACS Appl. Energy Mater., 1, 5490 (2018). doi: https://doi.org/10.1021/acsaem.8b01039
- C. G. Van de Walle and A. Janotti, Proc. 11th Europhysical Conference on Defects in Insulating Materials (EURODIM 2010) (University of Pecs, Hungary, 2010) p. 012001. doi: https://doi.org/10.1088/1757-899X/15/1/012001
- K. Okada, S. Kohiki, S. Luo, D. Sekiba, S. Ishii, M. Mitome, A. Kohno, T. Tajiri, and F. Shoji, Thin Solid Films, 519, 3557 (2011). doi: https://doi.org/10.1016/j.tsf.2011.01.249
- M. Ando, M. Takabatake, E. Nishimura, F. Leblanc, K. I. Onisawa, and T. Minemura, J. Non-Cryst. Solids, 198, 28 (1996). doi: https://doi.org/10.1016/0022-3093(95)00648-6
- S. Kim, J. Jung, Y. J. Lee, S. Ahn, S. Q. Hussain, J. Park, B. S. Song, S. Han, V. A. Dao, J. Lee, and J. Yi, Mater. Res. Bull., 58, 83 (2014). doi: https://doi.org/10.1016/j.materresbull.2014.05.003
- L. Zhao, C. L. Zhou, H. L. Li, H. W. Diao, and W. J. Wang, Phys. Status Solidi A, 205, 1215 (2008). doi: https://doi.org/10.1002/pssa.200723276
- EL-CAT Inc., Properties of Silicon and Silicon Wafers, https://www.el-cat.com/silicon-properties.htm
- Si - Silicon Electrical Properties, http://www.ioffe.ru/SVA/NSM/Semicond/Si/electric.html
- A.H.T. Le, V. A. Dao, D. P. Pham, S. Kim, S. Dutta, C.P.T. Nguyen, Y. Lee, Y. Kim, and J. Yi, Sol. Energy Mater. Sol. Cells, 192, 36 (2019). doi: https://doi.org/10.1016/j.solmat.2018.12.001
- C. Han, L. Mazzarella, Y. Zhao, G. Yang, P. Procel, M. Tijssen, A. Montes, L. Spitaleri, A. Gulino, X. Zhang, O. Isabella, and M. Zeman, ACS Appl. Mater. Interfaces, 11, 45586 (2019). doi: https://doi.org/10.1021/acsami.9b14709
- Y. Magari, T. Kataoka, W. Yeh, and M. Furuta, Nat. Commun., 13, 1078 (2022). doi: https://doi.org/10.1038/s41467-022-28480-9
- T. Koida, H. Fujiwara, and M. Kondo, Jpn. J. Appl. Phys., 46, L685 (2007). doi: https://doi.org/10.1143/JJAP.46.L685
- H. G. Park, S. Q. Hussain, J. Park, and J. Yi, J. Mater. Sci., 59, 13873 (2024). doi: https://doi.org/10.1007/s10853-024-09506-7
- S. Limpijumnong, P. Reunchan, A. Janotti, and C. G. Van de Walle, Phys. Rev. B, 80, 193202 (2009). doi: https://doi.org/10.1103/PhysRevB.80.193202
- H. G. Park and J. Yi, J. Korean Inst. Electr. Electron. Mater. Eng., 37, 439 (2024). doi: https://doi.org/10.4313/JKEM.2024.37.4.12