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A Review on Dielectric Breakdown of Anodic Oxide Films on Aluminum Alloys

  • Hien Van Pham (Energy & Environment Materials Research Division, Korea Institute of Materials Science) ;
  • Cheolnam Yang (Energy & Environment Materials Research Division, Korea Institute of Materials Science) ;
  • Sungmo Moon (Energy & Environment Materials Research Division, Korea Institute of Materials Science)
  • 투고 : 2024.07.03
  • 심사 : 2024.08.22
  • 발행 : 2024.08.31

초록

This paper reviews the dielectric breakdown resistance and behavior of anodic oxide films in air environment. It begins with a description of the dielectric breakdown mechanisms of dielectric materials. The paper then introduces different types of dielectric materials and compares them in terms of dielectric strength, thermal conductivity, mechanical strength and cost. Next, the paper summarizes various fabrication methods for dielectric aluminum oxide layers, discussing the advantages and disadvantages of each method. Finally, it provides an overview of current studies on the dielectric breakdown properties of anodic aluminum oxide films formed on different aluminum alloys in various electrolytes.

키워드

과제정보

This work was supported financially by Fundamental Research Program of the Korean Institute of Materials Science (PNK9790).

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