Acknowledgement
This research was supported by the Creative Materials Dis covery Program (2020M3D1A2102915) through the National Research Foundation of Korea (NRF) funded by Ministry of Science and ICT.
References
- K. Hong, T. H. Lee, J. M. Suh, S. H. Yoon, and H. W. Jang, J. Mater. Chem. C, 7, 9782 (2019). [DOI: https://doi.org/10.1039/ c9tc02921d]
- I. Seo, H. W. Kang, and S. H. Han, J. Korean Inst. Electr. Electron. Mater. Eng., 35, 103 (2022). [DOI: https://doi.org/ 10.4313/JKEM.2022.35.2.1]
- J. Yamamatsu, N. Kawano, T. Arashi, A. Sato, Y. Nakano, and T. Nomura, J. Power Sources, 60, 199 (1996). [DOI: https://doi. org/10.1016/S0378-7753(96)80011-5]
- D.F.K. Hennings, J. Eur. Ceram. Soc., 21, 1637 (2001). [DOI: https://doi.org/10.1016/S0955-2219(01)00082-6]
- K. Albertsen, D. Hennings, and O. Steigelmann, J. Electroceram., 2, 193 (1998). [DOI: https://doi.org/10.1023/A:1009926916939]
- G. Y. Yang, G. D. Lian, E. C. Dickey, C. A. Randall, D. E. Barber, P. Pinceloup, M. A. Henderson, R. A. Hill, J. J. Beeson, and D. J. Skamser, J. Appl. Phys., 96, 7500 (2004). [DOI: https://doi.org/10.1063/1.1809268]
- Y. Iida, J. Am. Ceram. Soc., 41, 397 (1958). [DOI: https://doi. org/10.1111/j.1151-2916.1958.tb13511.x]
- A. Cho, C. S. Han, M. Kang, W. Choi, J. Lee, J. Jeon, S. Yu, Y. S. Jung, and Y. S. Cho, ACS Appl. Mater. Interfaces, 10, 16203 (2018). [DOI: https://doi.org/10.1021/acsami.8b02630]
- G. Y. Yang, E. C. Dickey, C. A. Randall, D. E. Barber, P. Pinceloup, M. A. Henderson, R. A. Hill, J. J. Beeson, and D. J. Skamser, J. Appl. Phys., 96, 7492 (2004). [DOI: https://doi.org/ 10.1063/1.1809267]
- A. Uthayakumar, A. Pandiyan, S. Mathiyalagan, A. K. Keshri, and S.B.K. Moorthy, J. Phys. Chem. C, 124, 5591 (2020). [DOI: https://doi.org/10.1021/acs.jpcc.0c00166]
- J. W. Liu, D. Y. Lu, X. Y. Yu, Q. L. Liu, Q. Tao, H. Change, and P. W. Zhu, Acta Metall. Sin. (Engl. Lett.), 30, 97 (2016). [DOI: https://doi.org/10.1007/s40195-016-0522-y]
- H. J. Van Daal and A. J. Bosman, Phys. Rev., 158, 726 (1967). [DOI: https://doi.org/10.1103/PhysRev.158.736]
- M. D. Irwin, D. B. Buchholz, A. W. Hains, R.P.H. Chang, and T. J. Marks, Proc. Natl. Acad. Sci., 105, 2783 (2008). [DOI: https://doi.org/10.1073/pnas.0711990105]
- D. Y. Cho, S. J. Song, U. K. Kim, K. M. Kim, H. K. Lee, and C. S. Hwang, J. Mater. Chem. C, 1, 4334 (2013). [DOI: https://doi. org/10.1039/c3tc30687a]
- F. Jiang, W.C.H. Choy, X. Li, D. Zhang, and J. Cheng, Adv. Mater., 27, 2930 (2015). [DOI: https://doi.org/10.1002/adma. 201405391]
- R. Poulain, G. Lumbeeck, J. Hunka, J. Proost, H. Savolainen, H. Idrissi, D. Schryvers, N. Gauquelin, and A. Klein, ACS Appl. Electron. Mater., 4, 2718 (2022). [DOI: https://doi.org/10.1021/ acsaelm.2c00230