Abstract
The automotive industry is undergoing a paradigm shift due to the convergence of IT and rapid digital transformation. Various components, including embedded structures and systems with complex architectures that incorporate IC semiconductors, are being integrated and modularized. As a result, there has been a significant increase in vehicle defects, raising expectations for the quality of automotive parts. As more and more data is being accumulated, there is an active effort to go beyond traditional reliability analysis methods and apply machine learning models based on the accumulated big data. However, there are still not many cases where machine learning is used in product development to identify factors of defects in performance and durability of products and incorporate feedback into the design to improve product quality. In this paper, we applied a prediction algorithm to the defects of automotive door devices equipped with automatic responsive sensors, which are commonly installed in recent electric and hydrogen vehicles. To do so, we selected test items, built a measurement emulation system for data acquisition, and conducted comparative evaluations by applying different machine learning algorithms to the measured data. The results in terms of R2 score were as follows: Ordinary multiple regression 0.96, Ridge regression 0.95, Lasso regression 0.89, Elastic regression 0.91.