과제정보
본 연구 논문은 한국전자통신연구원 연구운영지원사업의 일환으로 수행되었음[21YB2810, 저차원 나노물질을 이용한 우주환경 내방사선 소자 및 경량 차폐 소재 개발].
참고문헌
- H.J. Barnaby, "Total-ionizing-dose effects in modern CMOS technologies," IEEE Trans. Nucl. Sci., vol. 53, no. 6, 2006, pp. 3103-3121. https://doi.org/10.1109/TNS.2006.885952
- 한국원자력연구원 첨단방사선연구소, https://www.kaeri.re.kr/arti/
- 한국원자력연구원 양성자과학연구단, https://komac.kaeri.re.kr:448/
- M. Bucher et al., "Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout," in Proc. IEEE Int. Conf. Microelectron. Test Structures (ICMTS), (Austin, TX, USA), Mar. 2018.
- A.T. Kelly et al., "Differential analog layout for improved ASET tolerance," IEEE Trans. Nucl. Sci., vol. 54, no. 6, 2007, pp. 2053-2059. https://doi.org/10.1109/TNS.2007.910124
- T. Calin, M. Nicolaidis, and R. Velazco, "Upset hardened memory design for submicron CMOS technology," IEEE Trans. Nucl. Sci., vol. 43, no. 6, 1996, pp. 2874-2878. https://doi.org/10.1109/23.556880
- O. Ruano, P. Reviriego, and J.A. Maestro, "Automatic insertion of selective TMR for SEU mitigation," in Proc. Eur. Conf. Radiat. Its Eff. Components Syst., (Jyvaskyla, Finland), Sept. 2008.
- S. Tambatkar et al., "Error detection and correction in semiconductor memories using 3D parity check code with hamming code," in Proc. Int. Conf. Commun. Signal Process. (ICCSP), (Chennai, India), Apr. 2017.
- S.J. Pearton et al., "Ionizing radiation damage effects on GaN devices," ECS J. Solid State Sci. Technol., vol. 5 no. 2, 2015, pp. 35-60.
- J.R. Schwank e t al., "Radiation effects in SOI technologies," IEEE Trans. Nucl. Sci., vol. 50. no. 3, 2003, pp. 522-538. https://doi.org/10.1109/TNS.2003.812930
- K . Hirose and D . Kobayashi, "Advantages and disadvantages of SOI in terms of radiation tolerance," in Proc. IEEE SOI-3D-Subthreshold Microelectron. Technol. Unified Conf., (Burlingame, CA, USA), Oct. 2018, pp. 1-4.
- F. Faccio and G. Cervelli, "Radiation-induced edge effects in deep submicron CMOS transistors," IEEE Trans. Nucl. Sci., vol. 52, no. 6, 2005, pp. 2413-2420. https://doi.org/10.1109/TNS.2005.860698
- M.P. King et al., "Analysis of TID process, geometry, and bias condition dependence in 14-nm FinFETs and implications for RF and SRAM performance," IEEE Trans. Nucl. Sci., vol. 61, no. 1, 2016, pp. 285-292.
- T. Vogl et al., "Radiation tolerance of two-dimensional material-based devices for space applications," Nat. Commun., vol. 10, 2019, pp. 1-10. https://doi.org/10.1038/s41467-018-07882-8
- A.V. Krasheninnikov, "Are two-dimensional materials radiation tolerant?," Nanoscale Horiz., vol. 5, 2020, pp. 1447-1452. https://doi.org/10.1039/d0nh00465k
- S. Mondal et al., "Gamma-ray tolerant flexible pressure-temperature sensor for nuclear radiation environment," Adv. Mater. Technol., vol. 6, no. 4, 2021, article no. 2001039.
- S.H. Gwon et al., "Sewable soft shields for the γ-ray radiation," Sci. Rep., vol. 8, 2018, pp. 1-7.
- 장태성, 이주훈, "우주용 방사차폐 구조 국내 연구 동향," 항공우주산업기술동향, 제15권 제2호, 2017, pp. 109-117.
- I.H. Seo e t al., "Proto flight model design and implementation of mass memory unit for STSAT-2," J. Korean Soc. Aeron. Space, vol. 36, 2008, pp. 195-201.
- Harris Corp. "3D prints RF amplifiers using nano dimension's dragonfly pro," DE247 Digital Engineering, 2018, p. 9.
- S. Kety, "Mini-Cubes 3D Printed its first satellite in carbon-composite and it is ready for flight," 3D Adept Media, July 2020.
- https://3dprint.com/278887/3d-printing-and-the-future-of-space/