Journal of IKEEE (전기전자학회논문지)

Institute of Korean Electrical and Electronics Engineers (한국전기전자학회)
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Automotive Semiconductor Serial Interfaces with Transmission Error Detection Using Cyclic Redundancy Check

순환 중복 검사를 통해 전송 오류를 검출하는 차량용 반도체 직렬 인터페이스

  • Received : 2022.09.11
  • Accepted : 2022.09.26
  • Published : 2022.09.30
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Abstract

This paper proposes a CRC error verification method for SPI and I2C buses of automotive semiconductors. In automotive semiconductors, when an error occurs in communication and an incorrect value is transmitted, fatal results may occur. Unlike LIN communication and CAN communication, in communication such as SPI and I2C, there is no frame for detecting an error, so some definitions of new standards are required. Therefore, in this paper, the CRC error detection mode is newly defined in the SPI and I2C communication protocols, and the verification is presented by designing it in hardware.

본 논문에서는 차량용 반도체에서 CRC 검사를 통해 전송 오류를 검출할 수 있는 SPI 버스 및 I2C 버스를 제안한다. 차량용 반도체에서는 전송에 오류가 발생하여 잘못된 값이 전달되는 경우 치명적인 결과가 발생한다. LIN 버스, CAN 버스와는 다르게 SPI와 I2C 등 구조가 간단한 직렬 인터페이스에서는 전송 오류를 검출하는 방법이 없기 때문에 직렬 인터페이스에 적용할 전송 오류 검출방법을 제시할 필요가 있다. 본 논문에서는 SPI 및 I2C의 통신 프로토콜에 CRC 검사를 사용하여 전송 오류를 검출하는 방법을 제시하고 이를 FPGA로 설계하여 효과적으로 오류를 검출할 수 있음을 검증하였다.

Keywords

Acknowledgement

This work was supported by the R&D programs of the Ministry of Trade, Industry and Energy (MOTIE) / Korea Evaluation Institute of Industrial Technology (KEIT). (20012624 and RS-2022-00154973)

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