참고문헌
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- Song-Yeon Lee and Yong-Jeong Huh, "A Study on Shape Warpage Defect Detection Model of Scaffold Using Deep Learning Based on CNN", J. of The Korean Society of Semiconductor & Display Technology, Vol.20, pp. 99-103, 2021.
- Song-Yeon Lee and Yong-Jeong Huh, "A Comparative Study on Deep Learning Models for Scaffold Defect Detection", J. of The Korean Society of Semiconductor & Display Technology, Vol.20, pp. 109-114, 2021.
- Jung-Hee Han and Sung-Soo Hong"Semiconductor Process Inspection Using Mask R-CNN", J. of The Korean Society of Semiconductor & Display Technology, Vol.19, pp. 12-14, 2020.
- Soo-Hyeon Lee, Dong-Hyun Kim and Hae-Yeoun Lee, "Camera Model Identification Using Modified DenseNet and HPF", J. of Korean Institute of Information Technology, Vol.17, pp. 11-19, 2019
- Shin-Young Ahn, Eun-Ji Lim and Wan Choi, "Trends on Distributed Frameworks for Deep Learning" Electronics and Telecommunications Trends, Vol.31, pp.131-141, 2016.
- Soo-Hyeon Lee, Dong-Hyun Kim and Hae-Yeoun Lee, "Camera Model Identification Using Modified DenseNet and HPF", J. of Korean Institute of Information Technology, Vol.17, pp. 11-19, 2019
- Yong-Hwan Lee and Young-Sub Kim, "Comparison of CNN and YOLO for Object Detection" J. of The Korea Society of Semiconductor & Display Technology, Vol.19, pp.85-92, 2020.