References
- A. Munoz-Noval, K. Fukami, A. Koyama, D. Gallach, D. Hermida-Merino, G. Portale, A. Kitada, K. Murase, T. Abe, S. Hayakawa, T. Sakka, Electrochem. Comm., 2016, 71, 9-12. https://doi.org/10.1016/j.elecom.2016.07.013
- S. H. Lee, J. S. Kang, D. Kim, Materials, 2018, 11(12), 2557. https://doi.org/10.3390/ma11122557
- S. Chen, S. S. Thind, A. Chen, Electrochem. Comm., 2016, 63, 10-17. https://doi.org/10.1016/j.elecom.2015.12.003
- I. Oh, J. Kye, S. Hwang, Nano Letters, 2012, 12(1), 298-302. https://doi.org/10.1021/nl203564s
- S.-J. Kim, J.-Y. Park, S.-H. Lee, S.-H. Yi, J. Physics D:Applied Physics, 2000, 33(15), 1781-84. https://doi.org/10.1088/0022-3727/33/15/305
- Y. Dahman. In Nanotechnology and Functional Materials for Engineers; Dahman, Y., Ed.; Elsevier:2017; pp 67-91.
- D.-I. Kim, C.-W. Lee, Bull. Korean Chem. Soc., 1995, 16(11), 1019-23.
- D. Kim, J. Kang, T. Wang, H. G. Ryu, J. M. Zuidema, J. Joo, M. Kim, Y. Huh, J. Jung, K. H. Ahn, K. H. Kim, M. J. Sailor, Advanced Materials, 2017, 29(39), 1703309. https://doi.org/10.1002/adma.201703309
- J. Wang, T. Kumeria, M. T. Bezem, J. Wang, M. J. Sailor, ACS Appl Mater Interfaces, 2018, 10(4), 3200-09. https://doi.org/10.1021/acsami.7b09071
- S.-H. Lee, C.-W. Lee, J. Korean Electrochem. Soc., 2000, 3, 39-43. https://doi.org/10.5229/JKES.2000.3.1.039
- M. Aliaghayee, H. G. Fard, A. Zandi, J. Electrochem. Sci. Technol., 2016, 7(3), 218-27. https://doi.org/10.5229/JECST.2016.7.3.218
- X. Li, M. Gu, S. Hu, R. Kennard, P. Yan, X. Chen, C. Wang, M. J. Sailor, J.-G. Zhang, J. Liu, Nature Comm., 2014, 5, 4105. https://doi.org/10.1038/ncomms5105
- N.-S. Choi, S.-Y. Ha, Y. Lee, J. Y. Jang, M.-H. Jeong, W. C. Shin, M. Ue, J. Electrochem. Sci. Technol, 2015, 6(2), 35-49. https://doi.org/10.5229/JECST.2015.6.2.35
- C.-W. Lee, D.-I. Kim, M.-K. Oh, Bull. Korean Chem. Soc., 1993, 14, 162-63.
- S. N. Sohimee, Z. Hassan, N. Mahmoud Ahmed, L. W. Foong, Q. Hock Jin, J. Physics: Conference Series, 2018, 1083, 012034.
- S. E. Bae, J. H. Yoon, C. W. J. Lee, Surf. Sci., 2008, 602(6), 1185-90. https://doi.org/10.1016/j.susc.2008.01.011
- S.-E. Bae, J.-H. Yoon, C.-W. J. Lee, I. C. Jeon, Electrochim. Acta, 2008, 53(21), 6178-83. https://doi.org/10.1016/j.electacta.2008.01.043
- S. E. Bae, J. H. Yoon, C. W. J. Lee, J. Phys. Chem. C, 2008, 112(5), 1533-38. https://doi.org/10.1021/jp076673m
- M. F. Faggin, S. K. Green, I. T. Clark, K. T. Queeney, M. A. Hines, J. Am. Chem. Soc., 2006, 128(35), 11455-62. https://doi.org/10.1021/ja062172n
- P. Allongue, C. H. de Villeneuve, S. Morin, R. Boukherroub, D. D. M. Wayner, Electrochim. Acta, 2000, 45(28), 4591-98. https://doi.org/10.1016/S0013-4686(00)00610-1
- P. Allongue, V. Costa?Kieling, H. Gerischer, J. Electrochem. Soc., 1993, 140(4), 1018-26. https://doi.org/10.1149/1.2056190
- S.-E. Bae, C.-W. Lee, J. Korean Electrochem. Soc., 2002, 5, 111-16. https://doi.org/10.5229/JKES.2002.5.3.111
- J. Salonen, E. Makila, Advanced Materials, 2018, 30(24), 1703819. https://doi.org/10.1002/adma.201703819
- T. Bitzer, M. Gruyters, H. J. Lewerenz, K. Jacobi, Applied Physics Letters, 1993, 63(3), 397-99. https://doi.org/10.1063/1.110054
- H. Gerischer, M. Lubke, Ber. Bunsenges. Phys. Chem., 1987, 91(4), 394-98. https://doi.org/10.1002/bbpc.19870910432
- K. Kaji, S. L. Yau, K. Itaya, J. Applied Physics, 1995, 78(9), 5727-33. https://doi.org/10.1063/1.359633
- S. L. Yau, K. Kaji, K. Itaya, Applied Physics Letters, 1995, 66(6), 766-68. https://doi.org/10.1063/1.114087
- P. Allongue, V. Kieling, H. Gerischer, Electrochim. Acta, 1995, 40 (10), 1353-60. https://doi.org/10.1016/0013-4686(95)00071-L
- S. E. Bae, M. K. Oh, N. K. Min, S. H. Paek, S. I. Hong, C. W. J. Lee, Bull. Korean Chem. Soc., 2004, 25(12), 1822-28. https://doi.org/10.5012/bkcs.2004.25.12.1822
- J.-N. Chazalviel, F. Maroun, F. Ozanam J. Electrochem. Soc., 2004, 151(2), E51-E55.