References
- X. Guo and E. F. Schubert, "Current crowding in GaN/ InGaN light emitting diodes on insulating substrates," J. Appl. Phys. 90, 4191-4195 (2001). https://doi.org/10.1063/1.1403665
- M.-H. Kim, M. F. Schubert, Q. Dai, J. K. Kim, E. F. Schubert, J. Piprek, and Y. Park, "Origin of efficiency droop in GaN-based light-emitting diodes," Appl. Phys. Lett. 91, 183507 (2007). https://doi.org/10.1063/1.2800290
- D.-S. Shin, D.-P. Han, J.-Y. Oh, and J.-I. Shim, "Study of droop phenomena in InGaN-based blue and green lightemitting diodes by temperature-dependent electroluminescence," Appl. Phys. Lett. 100, 153506 (2012). https://doi.org/10.1063/1.3703313
- Y. C. Shen, G. O. Mueller, S. Watanabe, N. F. Gardner, A. Munkholm, and M. R. Krames, "Auger recombination in InGaN measured by photoluminescence," Appl. Phys. Lett. 91, 141101 (2007). https://doi.org/10.1063/1.2785135
- M. Binder, A. Nirschl, R. Zeisel, T. Hager, H.-J. Lugauer, M. Sabathil, D. Bougeard, J. Wagner, and B. Galler, "Identification of nnp and npp Auger recombination as significant contributor to the efficiency droop in (GaIn)N quantum wells by visualization of hot carriers in photoluminescence," Appl. Phys. Lett. 103, 071108 (2013). https://doi.org/10.1063/1.4818761
- E. Kioupakis, P. Rinke, K. T. Delaney, and C. G. Van de Walle, "Indirect Auger recombination as a cause of efficiency droop in nitride light-emitting diodes," Appl. Phys. Lett. 98, 161107 (2011). https://doi.org/10.1063/1.3570656
- K. D. Chik, "A theoretical analysis of Auger recombination induced energetic carrier leakage in GaInAsP/InP double heterojunction lasers and light emitting diodes," J. Appl. Phys. 63, 4688-4698 (1988). https://doi.org/10.1063/1.340124
- A. Laubsch, M. Sabathil, W. Bergbauer, M. Strassburg, H. Lugauer, M. Peter, S. Lutgen, N. Linder, K. Streubel, J. Hader, J. V. Moloney, B. Pasenow, and S. W. Koch, "On the origin of IQE-'droop' in InGaN LEDs," Phys. Status Solidi C 6, S913-S916 (2009). https://doi.org/10.1002/pssc.200880950
- C.-K. Li and Y.-R. Wu, "Study on the current spreading effect and light extraction enhancement of vertical GaN/ InGaN LEDs," IEEE Trans. Electron Devices 59, 400-407 (2012). https://doi.org/10.1109/TED.2011.2176132
- Q.-H. Pham, J.-C. Chen, and H.-B. Nguyen, "Three-dimensional numerical study on the efficiency droop in InGaN/ GaN light-emitting diodes," IEEE Photon. J. 11, 1-17 (2019).
- L. Zhang, X. C. Wei, N. X. Liu, H. Lu, J. P. Zeng, J. X. Wang, Y. P. Zeng, and J. M. Li, "Improvement of efficiency of GaN-based polarization-doped light-emitting diodes grown by metalorganic chemical vapor deposition," Appl. Phys. Lett. 98, 241111 (2011). https://doi.org/10.1063/1.3601469
- S. Choi, H. J. Kim, S.-S. Kim, J. Liu, J. Kim, J.-H. Ryou, R. D. Dupuis, A. M. Fischer, and F. A. Ponce, "Improvement of peak quantum efficiency and efficiency droop in IIInitride visible light-emitting diodes with an InAlN electronblocking layer," Appl. Phys. Lett. 96, 221105 (2010). https://doi.org/10.1063/1.3441373
- Y.-Y. Zhang, X.-L. Zhu, Y.-A. Yin, and J. Ma, "Performance enhancement of near-UV light-emitting diodes with an InAlN/GaN superlattice electron-blocking layer," IEEE Electron Device Lett. 33, 994-996 (2012). https://doi.org/10.1109/LED.2012.2197593
- S.-H. Han, D.-Y. Lee, S.-J. Lee, C.-Y. Cho, M.-K. Kwon, S. P. Lee, D. Y. Noh, D.-J. Kim, Y. C. Kim, and S.-J. Park, "Effect of electron blocking layer on efficiency droop in InGaN/GaN multiple quantum well light-emitting diodes," Appl. Phys. Lett. 94, 231123 (2009). https://doi.org/10.1063/1.3153508
-
K.-H. Kim, S.-W. Lee, S.-N. Lee, and J. Kim, "Effect of p-
$Al_xGa_{1-x}N$ electron blocking layer on optical and electrical properties in GaN-based light emitting diodes," J. Vac. Sci. Technol. B: Nanotechnol. Microelectron.: Mater., Process., Meas., Phenom. 30, 061204 (2012). - L. Zhang, K. Ding, N. X. Liu, T. B. Wei, X. L. Ji, P. Ma, J. C. Yan, J. X. Wang, Y. P. Zeng, and J. M. Li, "Theoretical study of polarization-doped GaN-based lightemitting diodes," Appl. Phys. Lett. 98, 101110 (2011). https://doi.org/10.1063/1.3565173
- C. S. Xia, Z. M. Simon Li, and Y. Sheng, "On the importance of AlGaN electron blocking layer design for GaNbased light-emitting diodes," Appl. Phys. Lett. 103, 233505 (2013). https://doi.org/10.1063/1.4839417
- S. H. Tu, J. C. Chen, F. S. Hwu, G. J. Sheu, F. L. Lin, S. Y. Kuo, J. Y. Chang, and C. C. Lee, "Characteristics of current distribution by designed electrode patterns for high power ThinGaN LED," Solid-State Electron. 54, 1438-1443 (2010). https://doi.org/10.1016/j.sse.2010.04.044
- B. Galler, P. Drechsel, R. Monnard, P. Rode, P. Stauss, S. Froehlich, W. Bergbauer, M. Binder, M. Sabathil, and B. Hahn, "Influence of indium content and temperature on Auger-like recombination in InGaN quantum wells grown on (111) silicon substrates," Appl. Phys. Lett. 101, 131111 (2012). https://doi.org/10.1063/1.4754688
- B. Hahn, B. Galler, and K. Engl, "Development of highefficiency and high-power vertical light emitting diodes," Jpn. J. Appl. Phys. 53, 100208 (2014). https://doi.org/10.7567/JJAP.53.100208
- N. D. Arora, J. R. Hauser, and D. J. Roulston, "Electron and hole mobilities in silicon as a function of concentration and temperature," IEEE Trans. Electron Devices 29, 292-295 (1982). https://doi.org/10.1109/T-ED.1982.20698
- J. Piprek and S. Li, "Electron leakage effects on GaN-based light-emitting diodes," Opt. Quantum Electron. 42, 89-95 (2010). https://doi.org/10.1007/s11082-011-9437-z
- V. Fiorentini, F. Bernardini, and O. Ambacher, "Evidence for nonlinear macroscopic polarization in III-V nitride alloy heterostructures," Appl. Phys. Lett. 80, 1204-1206 (2002). https://doi.org/10.1063/1.1448668
- J.-R. Chen, C.-H. Lee, T.-S. Ko, Y.-A. Chang, T.-C. Lu, H.-C. Kuo, Y.-K. Kuo, and S.-C. Wang, "Effects of built-in polarization and carrier overflow on InGaN quantum-well lasers with electronic blocking layers," J. Lightwave Technol. 26, 329-337 (2008). https://doi.org/10.1109/JLT.2007.909908
- D. J. Griffiths, "Introduction to electrodynamics," Am. J. Phs. 73, 574 (2005). https://doi.org/10.1119/1.4766311
- P. Tian, J. J. D. McKendry, J. Herrnsdorf, S. Watson, R. Ferreira, I. M. Watson, E. Gu, A. E. Kelly, and M. D. Dawson, "Temperature-dependent efficiency droop of blue InGaN micro-light emitting diodes," Appl. Phys. Lett. 105, 171107 (2014). https://doi.org/10.1063/1.4900865
- E. Kioupakis, Q. Yan, D. Steiauf, and C. G. Van de Walle, "Temperature and carrier-density dependence of Auger and radiative recombination in nitride optoelectronic devices," New J. Phys. 15, 125006 (2013). https://doi.org/10.1088/1367-2630/15/12/125006
- H. Fu, Z. Lu, and Y. Zhao, "Analysis of low efficiency droop of semipolar InGaN quantum well light-emitting diodes by modified rate equation with weak phase-space filling effect," AIP Advances 6, 065013 (2016). https://doi.org/10.1063/1.4954296
- H.-Y. Ryu, D.-S. Shin, and J.-I. Shim, "Analysis of efficiency droop in nitride light-emitting diodes by the reduced effective volume of InGaN active material," Appl. Phys. Lett. 100, 131109 (2012). https://doi.org/10.1063/1.3698113
- Q. Dai, M. F. Schubert, M. H. Kim, J. K. Kim, E. F. Schubert, D. D. Koleske, M. H. Crawford, S. R. Lee, A. J. Fischer, G. Thaler, and M. A. Banas, "Internal quantum efficiency and nonradiative recombination coefficient of GaInN/GaN multiple quantum wells with different dislocation densities," Appl. Phys. Lett. 94, 111109 (2009). https://doi.org/10.1063/1.3100773
- Y. C. Shen, G. O. Mueller, S. Watanabe, N. F. Gardner, A. Munkholm, and M. R. Krames, "Auger recombination in InGaN measured by photoluminescence," Appl. Phys. Lett. 91, 141101 (2007). https://doi.org/10.1063/1.2785135
- X. Meng, L. Wang, Z. Hao, Y. Luo, C. Sun, Y. Han, B. Xiong, J. Wang, and H. Li, "Study on efficiency droop in InGaN/GaN light-emitting diodes based on differential carrier lifetime analysis," Appl. Phys. Lett. 108, 013501 (2016). https://doi.org/10.1063/1.4939593
- B.-C. Lin, K.-J. Chen, C.-H. Wang, C.-H. Chiu, Y.-P. Lan, C.-C. Lin, P.-T. Lee, M.-H. Shih, Y.-K. Kuo, and H.-C. Kuo, "Hole injection and electron overflow improvement in InGaN/GaN light-emitting diodes by a tapered AlGaN electron blocking layer," Opt. Express 22, 463-469 (2014). https://doi.org/10.1364/OE.22.000463
- E. F. Schubert, T. Gessmann, and J. K. Kim, "Light emitting diodes," in Kirk-Othmer Encyclopedia of Chemical Technology, 2nd ed. (John Wiley & Sons, NY, USA. 2005).
- A. David and M. J. Grundmann, "Droop in InGaN lightemitting diodes: A differential carrier lifetime analysis," Appl. Phys. Lett. 96, 103504 (2010). https://doi.org/10.1063/1.3330870
- J. Piprek, "Efficiency droop in nitride-based light-emitting diodes," Phys. Status Solidi A 207, 2217-2225 (2010). https://doi.org/10.1002/pssa.201026149
- C.-K. Sun, S. Keller, G. Wang, M. Minsky, J. E. Bowers, and S. P. DenBaars, "Radiative recombination lifetime measurements of InGaN single quantum well," Appl. Phys. Lett. 69, 1936-1938 (1996). https://doi.org/10.1063/1.117627
- F. Romer and B. Witzigmann, "Effect of Auger recombination and leakage on the droop in InGaN/GaN quantum well LEDs," Opt. Express 22, A1440-A1452 (2014). https://doi.org/10.1364/OE.22.001440
- H. Zhao, G. Liu, J. Zhang, R. A. Arif, and N. Tansu, "Analysis of internal quantum efficiency and current injection efficiency in III-nitride light-emitting diodes," J. Disp. Technol. 9, 212-225 (2013). https://doi.org/10.1109/JDT.2013.2250252
- M. Deppner, F. Romer, and B. Witzigmann, "Auger carrier leakage in III-nitride quantum-well light emitting diodes," Phys. Status Solidi Rapid Res. Lett. 6, 418-420 (2012). https://doi.org/10.1002/pssr.201206367
- J. Hader, J. V. Moloney, B. Pasenow, S. W. Koch, M. Sabathil, N. Linder, and S. Lutgen, "On the importance of radiative and Auger losses in GaN-based quantum wells," Appl. Phys. Lett. 92, 261103 (2008). https://doi.org/10.1063/1.2953543
- C. H. Wang, C. C. Ke, C. Y. Lee, S. P. Chang, W. T. Chang, J. C. Li, Z. Y. Li, H. C. Yang, H. C. Kuo, T. C. Lu, and S. C. Wang, "Hole injection and efficiency droop improvement in InGaN/GaN light-emitting diodes by bandengineered electron blocking layer," Appl. Phys. Lett. 97, 261103 (2010). https://doi.org/10.1063/1.3531753
- R. M. Perks, A. Porch, D. V. Morgan, and J. Kettle, "Theoretical and experimental analysis of current spreading in AlGaInP light emitting diodes," J. Appl. Phys. 100, 083109 (2006). https://doi.org/10.1063/1.2358396
- B. Laikhtman, A. Gourevitch, D. Donetsky, D. Westerfeld, and G. Belenky, "Current spread and overheating of high power laser bars," J. Appl. Phys. 95, 3880-3889 (2004). https://doi.org/10.1063/1.1655687