한국전기전자재료학회논문지 (Journal of the Korean Institute of Electrical and Electronic Material Engineers)

  • 제33권2호
  • /
  • Pages.151-154
  • /
  • 2020
  • /
  • 1226-7945(pISSN)
  • /
  • 2288-3258(eISSN)
한국전기전자재료학회 (The Korean Institute of Electrical and Electronic Material Engineers)
권호 표지
DOI QR코드

DOI QR Code

LED 조명기구의 EMI 디버깅 기술

EMI Debugging Technique of LED Lighting Module

  • 김진사 (조선이공대학교 자동화시스템과)
  • Kim, Jin Sa (Department of Automatic System, Chosun College of Science & Technology)
  • 투고 : 2019.12.01
  • 심사 : 2019.12.19
  • 발행 : 2020.03.01
PDF 다운로드
⟨ 이전 논문 다음 논문 ⟩

초록

Radiation noise due to EMI noise generated by the driving circuits of LED lighting devices in a medical imaging room was reduced by decreasing the noise source in the driving circuits and changing the number of corrections in EMI filters. Noise attenuation and filter changes enabled driving circuits that reduced the electromagnetic waves. Such circuits were efficiently designed by using capacitors and inverters in a given space. Therefore, the malfunction of radiation devices can be minimized by using EMI-reduction filter circuits, and reliable operation of medical devices can be expected by blocking electromagnetic waves.

키워드

참고문헌

  1. N. Narendran, N. Maliyagoda, L. Deng, and R. M. Pysar, Proc. International Symposium on Optical Science and Technology (SPIE, San Diego, USA, 2001) p. 240. [DOI: https://doi.org/10.1117/12.450037]
  2. F. M. steranka, J. Bhat, D. Collins, L. Cook, M. G. Craford, R. Fletcher, N. Gardner, P. Grillot, W. Goetz, M. Keuper, R. Khare, A. Kim, M. Krames, G. Harbers, M. Ludowise, P. S. Martin, M. Misra, G. Mueller, R. Mueller-Mach, S. Rudaz, Y. C. Shen, D. Steigerwald, S. Stockman, S. Subramanya, T. Trottier, and J. J. Wierer, Phys. Status Solid A, 194, 380 (2002). [DOI: https://doi.org/10.1002/1521-396X(200212)194:2<380::AIDPSSA380>3.0.CO;2-N]
  3. G. Dionyz, K. Frantisek, and S. Alfonz, CIE 26th Session (2007).
  4. M. S. Rea, Lighting handbook: Reference and application, 9th Edition, Illuminating Engineering Society of North America (IESNA), New York, 2000.
  5. T. C. Neugebauer and D. J. Perreault, IEEE Trans. Power Electron., 21, 282 (2006). [DOI: https://doi.org/10.1109/TPEL.2005.861103]
  6. S. Ye, W. Eberle, and Y. F. Liu, IEEE Trans. Power Electron., 19, 1668 (2004). [DOI: https://doi.org/10.1109/TPEL.2004.836629]