Current Applied Physics

Korean Physical Society (한국물리학회)
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Comparison of light-induced degradation and regeneration in P-type monocrystalline full aluminum back surface field and passivated emitter rear cells

  • Cho, Eunhwan (School of Electrical and Computer Engineering, Georgia Institute of Technology) ;
  • Rohatgi, Ajeet (School of Electrical and Computer Engineering, Georgia Institute of Technology) ;
  • Ok, Young-Woo (School of Electrical and Computer Engineering, Georgia Institute of Technology)
  • Received : 2018.07.11
  • Accepted : 2018.10.17
  • Published : 2018.12.31
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Abstract

This paper reports on a systematic and quantitative assessment of light induced degradation (LID) and regeneration in full Al-BSF and passivated emitter rear contact cells (PERC) along with the fundamental understanding of the difference between the two. After LID, PERC cells showed a much greater loss in cell efficiency than full Al-BSF cells (~0.9% vs ~0.6%) because the degradation in bulk lifetime also erodes the benefit of superior BSRV in PERC cells. Three main regeneration conditions involving the combination of heat and light ($75^{\circ}C/1\;Sun/48h$, $130^{\circ}C/2\;Suns/1.5h$ and $200^{\circ}C/3\;Suns/30s$) were implemented to eliminate LID loss due to BO defects. Low temperature/long time ($75^{\circ}C/48h$) and high temperature/short time ($200^{\circ}C/30s$) regeneration process was unable to reach 100% stabilization. The intermediate temperature/time ($130^{\circ}C/1.5h$) generation achieved nearly full recovery and stabilization (over 99%) for both full Al-BSF and PERC cells. We discussed the effect of temperature, time and suns in regeneration mechanism for two cells.

Keywords

Acknowledgement

Supported by : Korea Institute of Energy Technology Evaluation and Planning

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