References
- M. J. Suriani and W. B. Wan Nik, Corros. Sci. Tech., 16, 85 (2017).
- M. Y. shon, Corros. Sci. Tech., 8, 103 (2009).
- M. Y. shon and H. S. Kwon, Corros. Sci. Tech., 7, 344 (2008).
- M. Zhang, S. Feng, L. Wang, and Y. Zheng, Biotribology, 5, 31 (2016). https://doi.org/10.1016/j.biotri.2015.08.002
- H. J. Ensikat, P. D. Kuru, C. Neinhuis, and W. Barthlott, Beilstein J. Nanotech., 2, 152 (2011). https://doi.org/10.3762/bjnano.2.19
- S. S. Latthe, C. Terashima, K. Nakata, and A. Fujishima, Molecules, 19, 4256 (2014). https://doi.org/10.3390/molecules19044256
- W. Ma, Q. Zhang, D. Hua, R. Xiong, and J. Zhao, RSC Adv., 6, 12868 (2016). https://doi.org/10.1039/C5RA27309A
- S. A. Mahadik, P. D. Fernando, N. D. Hegade, P. B. Wagh, and S. C. Gupta, J. Colloid Interf. Sci., 405, 262 (2013). https://doi.org/10.1016/j.jcis.2013.04.042
- L. Wang, M. Wen, M. Zhang, L. Jiang, and Y. Zheng, J. Mater. Chem. A, 2, 3312 (2014). https://doi.org/10.1039/c3ta14779g
- X. Zhang, F. Shi, X. Yu, H. Liu, Y. Fu, Z. Wang, L. Jiang, and X. Li, J. Am. Chem. Soc., 126, 3064 (2004). https://doi.org/10.1021/ja0398722
- B. Balu, V. Breedveld, and D. W. Hess, Langmuir, 24, 4785 (2008). https://doi.org/10.1021/la703766c
- H. C. Barshilia and N. Gupta, Vacuum, 99, 42 (2014). https://doi.org/10.1016/j.vacuum.2013.04.020
- K. Teshima, H. Sugimura, Y. Inoue, O. Takai, and A. Takano, Appl. Surf. Sci., 244, 619 (2005). https://doi.org/10.1016/j.apsusc.2004.10.143
- S. A. Mahadik, M. S. Kavale, S. K. Mukherjee, and A. V. Rao, Appl. Surf. Sci., 257, 333 (2010). https://doi.org/10.1016/j.apsusc.2010.06.062
- A. caldarelli, M. Raimondo, F. Veronesi, G. Boveri, and G. Guarini, Surf. Coat. Technol., 276, 408 (2015). https://doi.org/10.1016/j.surfcoat.2015.06.037
- P. Peng, Q. Ke, G. Zhou, and T. Tang, J. Colloid Interf. Sci., 395, 326 (2013). https://doi.org/10.1016/j.jcis.2012.12.036
- L. Feng, Y. Song, J. Zhai, B. Liu, J. Xu, L. Jiang, and D. Zhu, Angew. Chem. Int. Ed., 42, 800 (2003). https://doi.org/10.1002/anie.200390212
- T. Ogawa, B. Ding, Y. Sone, and S. Shiratori, Nanotechnology, 18, 165607 (2007). https://doi.org/10.1088/0957-4484/18/16/165607
- S. Amigoni, E. T. de Givenchy, M. Dufay, and F. Guittard, Langmuir, 25, 11073 (2009). https://doi.org/10.1021/la901369f
- S. H. Lee, E. Y. Byun, J. K. Kim, and D. G. Kim, Curr. Appl. Phys., 14, S180 (2014). https://doi.org/10.1016/j.cap.2013.12.031
- G. M. Shanthini, C. A. Martin, N. Sakthivel, S. C. Veerla, K. Elayaraja, B. S. Lakshmi, K. Asokan, D. Kanjilal, and S. N. Kalkura, Appl. Surf. Sci., 329, 116 (2015). https://doi.org/10.1016/j.apsusc.2014.12.129
- W. Y. Ding, D. Y. Ju, and W. P. Chai, Appl. Surf. Sci., 256, 6876 (2010). https://doi.org/10.1016/j.apsusc.2010.04.104
- J. H. Lee, S. H. Lee, D. Y. Kim, and Y. S. Park, Thin Solid Films, 546, 94 (2013). https://doi.org/10.1016/j.tsf.2013.05.018
- E. Francisco, I. C. Sanchez, B. L. Espana-Sanchez, M. Josue D, C. Salvador, P. Fabienne, and L. Gabriel, Nucl. Instrum. Meth. B, 362, 49 (2015). https://doi.org/10.1016/j.nimb.2015.09.027