참고문헌
- Van der, P. and Wel, "Ignition and Propagation of Dust Explosions", Delft Univ. Press, pp. 152-157, 1993.
- Seop Woo Han, "Research Trend of Dust Explosion Hazard in Industrial Sites", Korea Occupational Safety & Health Agency, vol. 12, pp. 20-25, August 2008.
- Eckhoff, R. K., "Dust explosions in the Process Industries-3rd ed.", Gulf Professional Publishing, pp. 199-250, 2003.
- Seung Hyun Kim, Jeong Ah Shin, Hae Dong Park, "Exposure Possibility to By-products during the Processes of Semiconductor Manufacture", Korean Industrial Hygiene Association, vol. 22, no. 1, pp. 52-59, April 2012.
- NFPA 652, "Standard on the Fundamentals of Combustible Dust", pp. 6-9, 2016 edition.
- NFPA 654 "Standard for the Prevention of Fire and Dust Explosions from the Manufacturing, Processing, and Handling of Combustible Particulate Solids", 2013 edition.
- OSHA 3371-08-2009, "Hazard Communication Guidance for Combustible Dusts", 2009.
- Woo Jin Jeong, Nagaihirosi, "Explosion Characteristics of Magnesium Dust According to Particle Size", Journal of Korean Society of Hazard Mitigation, vol. 13, no. 2, pp. 203-208, 2013. https://doi.org/10.9798/KOSHAM.2013.13.2.203
- Database for Major industrial accidents, Korea Occupational Safety and Health Agency, 1988-2015.
- Fire and explosion accident data, JNIOSH 2014.
- US. Chemical Safety Board report (CSB) 2014.
- Jung Gyun Kuk, Eun Cheol Oh, Yeong Geun Baek, Study on the ignition of the painting booth",Congress of the korean Institute of Fire Investigation, vol. 20, pp. 147-171, April 2010.
- KOSHA CODE D-34-1999 "Technical Guidelines for the Prevention of Dust Explosion", Korea Occupational Safety & Health Agency, 1999.
- KOSHA CODE D-40-2000 "Dust Collection Equipment Dust Explosion Prevention Technical Guidelines", Korea Occupational Safety & Health Agency, 2000.
- KOSHA Guide P-41-2012 "Technical Guidelines on Width Federal Outlet Installation Methods to Prevent Dust Explosion", Korea Occupational Safety and Health Agency, 2012.
- KOSHA Guide P-128-2012, Korea Occupational Safety & Health Agency, 2012.
- Nakbae Kim, "Characterization of Semiconductor Using Neutron Activation Analysis-II - Manufacturing Process and Surface Depth Profile analysis -", Analytical Science and Technology, vol. 11, no. 6, pp. 1065-1074, 1998
- ISO-13320 "Particle Size Analysis-Laser Diffraction Methods, Part 1 : General Principle, 2009