IEMEK Journal of Embedded Systems and Applications (대한임베디드공학회논문지)

Institute of Embedded Engineering of Korea (대한임베디드공학회)
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Monitoring Methodology Based on Block Erase Count for Classifying Target Blocks Between Garbage Collection and Wear Leveling

가비지 컬렉션과 마모도 평준화 대상 블록의 구분을 위한 블록 소거 횟수 기반 모니터링 기법

  • Received : 2017.05.15
  • Accepted : 2017.05.29
  • Published : 2017.06.30
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Abstract

In this paper, we propose BCMR (Block Classification with Monitor and Restriction) to ensure the isolation and to reduce the interference of blocks between a garbage collection and a wear leveling. The proposed BCMR monitors an endurance variation of blocks during the garbage collection and detects hot blocks by making a restriction condition based on this information. The proposal induces a block classification by its update frequency for the garbage collection and the wear leveling, so we will get a prolonged lifetime of NAND flash memory systems. In a performance evaluation, BCMR prolonged the lifetime of NAND flash memory systems by 3.95%, on average and reduced a standard deviation per block by 7.4%, on average.

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References

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