References
- Andrea Cerioli. 2005. "K-means Cluster Analysis and Mahalanobis Metrics: a problematic match or an overlooked opportunity." Statistica Applicata 17:61-73.
- Asha Bharambe, Rahul Ravindra, Riya Suchdev, and Yash Tanna. 2014. "A Robust Anomaly Detection System." IEEE International Conference on Advances in Engineering & Technology Research 1-7.
- Ghislain Verdier, and Ariane Ferreira. 2011. "Adaptive Mahalanobis Distance and k-Nearest Neighbor Rule for Fault Detection in Semiconductor Manufacturing." IEEE Transactions Semiconductor Manufacturing 24(1):59-68. https://doi.org/10.1109/TSM.2010.2065531
- J. E. Kwak, and C. W. Kim. 2013. "Adaptive Clustering Based k-Nearest Neighbor Algorithm for Process Fault Detection." Proceedings of KORMS/KIIE Spring Joint Conference 1169-1175.
- J. M. Pena, J. A. Lozano, and P. Larranaga. 1999. "An Empirical Comparison of Four Initialization Methods for the K-means Algorithm.", Pattern Recognition Letters 20(10):1-17. https://doi.org/10.1016/S0167-8655(98)00119-6
- Ji Hoon Kang, and Seoung Bum Kim. 2013. "A Clustering Algorithm-Based Control Chart for Inhomogeneously Distributed TFT-LCD Process." International Journal of Production Research 51(18):5644-5657. https://doi.org/10.1080/00207543.2013.793427
- Malika Charrad, Nadia Ghazzali, Veronique Boiteau, and Azam Niknafs. 2014. "NbClust: An R Package for Determining the Relevant Number of Clusters in a Dataset." Journal of Statistical Software 61(6):1-36.
- R. Gnanadesikan, J. W. Harvey, and J. R. Kettenring. 1993. "Mahalanobis Metrics for Cluster Analysis." The Indian Journal of Statistics Series A(1961-2002) 55(3):494-505.
- S. Bersimis, S. Psarakis, and J. Panaretos. 2007. "Multivariate Statistical Process Control Charts: an Overview." Quality and Reliability Engineering International 23(5):517-543. https://doi.org/10.1002/qre.829
- Sachin Kumar, W. S. Chow, and Michael Pecht. 2010. "Approach to Fault Identification for Electronic Products Using Mahalanobis Distance." IEEE Transactions on Instrumentation and Measurement 59(8):2055-2064. https://doi.org/10.1109/TIM.2009.2032884
- T. H. Lee, and C. W. Kim. 2013. "Statistical Comparison of Data Mining Models for Fault Diagnosis in an Etching process." Proceedings of KORMS/KIIE Spring Joint Conference 1887-1895.