Electrical & Electronic Materials (E2M - 전기 전자와 첨단 소재)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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표면 및 물성 분석 기술로써 주사 탐침 현미경의 발전 (부제: PFM과 ESM의 소개)

  • 양상모 (숙명여자대학교 나노물리학과)
  • Published : 2017.01.01
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References

  1. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982) https://doi.org/10.1103/PhysRevLett.49.57
  2. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986) https://doi.org/10.1103/PhysRevLett.56.930
  3. Y.-H. Hsieh, E. Strelcov, J.-M. Liou, C.-Y. Shen, Y.-C. Chen, S. V. Kalinin, and Y.-H. Chu, ACS Nano 7, 8627 (2013) https://doi.org/10.1021/nn402763w
  4. O. Kolosov, A. Gruverman, J. Hatano, K. Takahashi, and H. Tokumoto, Phys. Rev. Lett. 74, 4309 (1995) https://doi.org/10.1103/PhysRevLett.74.4309
  5. A. Gruverman, O. Kolosov, J. Hatano, K. Takahashi, and H. Tokumoto, J. Vac. Sci. Technol. B 13, 1095 (1995)
  6. S. V. Kalinin, A. N. Morozovska, L. Q. Chen, and B. J. Rodriguez, Rep. Prog. Phys. 73, 056502 (2010) https://doi.org/10.1088/0034-4885/73/5/056502
  7. A. Gruverman and S. V. Kalinin, J. Mater. Sci. 41, 107 (2006) https://doi.org/10.1007/s10853-005-5946-0
  8. https://en.wikipedia.org/wiki/Piezoresponse_force_microscopy#/media/File:Piezoresponse_of_parallel_and_antiparallel_domains.png
  9. T. Zhao, A. Scholl, F. Zavaliche, K. lee, M. Barry, A. Doran, M. P. Cruz, Y. H. Chu, C. Ederer, N. A. Spaldin, R. R. Das, D. M. Kim, S. H. Baek, C. B. Eom, and R. Ramesh, Nat. Mater. 5, 823 (2006) https://doi.org/10.1038/nmat1731
  10. S. V. Kalinin, B. J. Rodriguez, S. Jesse, J. Shin, A. P. Baddorf, P. Gupta, H. Jain, D. B. Williams, and A. Gruverman, Microsc. Microanal. 12, 206 (2006)
  11. V. Garcia, S. Fusil, K. Bouzehouane, S. Enouz-Vedrenne, N. D. Mathur, A. Barthelemy, and M. Bibes, Nature 460, 81 (2009) https://doi.org/10.1038/nature08128
  12. J. Seidel, L. W. Martin, Q. He, Q. Zhan, Y. H. Chu, A. Rother, M. E. Hawkridge, P. Maksymovych, P. Yu, M. Gajek, N. Balke, S. V. Kalinin, S. Gemming, F. Wang, G. Catalan, J. F. Scott, N. A. Spaldin, J. Orenstein, and R. Ramesh, Nat. Mater. 8, 229 (2009) https://doi.org/10.1038/nmat2373
  13. S. M. Yang, J.-G. Yoon, and T. W. Noh, Curr. Appl. Phys. 11, 1111 (2011) https://doi.org/10.1016/j.cap.2011.05.017
  14. S. M. Yang, J. Y. Jo, D. J. Kim, H. Sung, T. W. Noh, H. N. Lee, J.-G. Yoon, and T. K. Song, Appl. Phys. Lett. 92, 252901 (2008) https://doi.org/10.1063/1.2949078
  15. D. J. Kim, J. Y. Jo, T. H. Kim, S. M. Yang, B. Chen, Y. S. Kim, and T. W. Noh, Appl. Phys. Lett. 91, 132903 (2007) https://doi.org/10.1063/1.2790485
  16. N. Balke, S. Jesse, A. N. Morozovska, E. A. Eliseev, D. W. Chung, Y. Kim, L. Adamczyk, R. E. Garcia, N. Dudney, and S. V. Kalinin, Nat. Nanotechnol. 5, 749 (2010) https://doi.org/10.1038/nnano.2010.174
  17. N. Balke, S. Jesse, Y. Kim, L. Adamczyk, A. Tselev, I. N. Ivanov, N. J. Dudney, and S. V. Kalinin, Nano Lett. 10, 3420 (2010) https://doi.org/10.1021/nl101439x
  18. A. Kumar, F. Ciucci, A. N. Morozovska, S. V. Kalinin, and S. Jesse, Nat. Chem. 3, 707 (2011) https://doi.org/10.1038/nchem.1112
  19. S. M. Yang, S. Lee, J. Jian, W. Zhang, P. Lu, Q. Jia, H. Wang, T. Won Noh, S. V. Kalinin, and J. L. MacManus-Driscoll, Nat. Commun. 6, 8588 (2015) https://doi.org/10.1038/ncomms9588