References
- B. Lee, "Review of the present status of optical fiber sensors", Opt. Fiber Technol., Vol. 9, No. 2, pp. 57-79, 2003. https://doi.org/10.1016/S1068-5200(02)00527-8
- R. C. Turner, P. A. Fuierer, R. E. Newnham, and T. R. Shrout, "Materials for high temperature acoustic and vibration sensors: a review", Appl. Acoust., Vol. 41, No. 4, pp.299-324, 1994. https://doi.org/10.1016/0003-682X(94)90091-4
- J. B. Casady, and R. W. Johnson, "Status of silicon carbide (SiC) as a wide-bandgap semiconductor for high-temperature applications: A review", Solid-State Electron., Vol. 39, No. 10, pp. 1409-1422, 1996. https://doi.org/10.1016/0038-1101(96)00045-7
- C. K. Leung, K. T. Wan, D. Inaudi, X. Bao, W. Habel, Z. Zhou, J. Ou, M. Ghandehari, H. C. Wu, and M. Imai, "Review: optical fiber sensors for civil engineering applications", Mater. Struct., Vol. 48, No. 4, pp. 871-906, 2015. https://doi.org/10.1617/s11527-013-0201-7
- C. Fernandez-Valdivielso, I. R. Matias, and F. J. Arregui, "Simultaneous measurement of strain and temperature using a fiber Bragg grating and a thermochromic material", Sens. Actuators, A, Vol. 101, No. 1, pp. 107-116, 2002. https://doi.org/10.1016/S0924-4247(02)00188-7
- J. Kim, J. A. Hanna, M. Byun, C. D. Santangelo, and R. C. Hayward, "Designing responsive buckled surfaces by halftone gel lithography", Science, Vol. 335, No. 6073, pp. 1201-1205, 2012. https://doi.org/10.1126/science.1215309
- J.-H. Na, A. A. Evans, J. Bae, M. C. Chiappelli, C. D. Santangelo, R. J. Lang, T. C. Hull, and R. C. Hayward, "Programming reversibly self - folding origami with micropatterned photo - crosslinkable polymer trilayers", Adv. Mater., Vol. 27, No. 1, pp. 79-85, 2015. https://doi.org/10.1002/adma.201403510
- J.-H. Na, N. P. Bende, J. Bae, C. D. Santangelo, and R. C. Hayward, "Grayscale gel lithography for programmed buckling of non-Euclidean hydrogel plates", Soft matter, Vol. 12, No. 22, pp. 4985-4990, 2016. https://doi.org/10.1039/C6SM00714G
- G. G. Stoney, "The Tension of Metallic Films Deposited by Electrolysis", Proc. R. Soc. Lond. A, Vol. 82, No. 553, pp. 172-175, 1909. https://doi.org/10.1098/rspa.1909.0021
- L. B. Freund and S. Suresh, Thin Film Materials: Stress, Defect Formation and Surface Evolution, Cambridge University Press, 2003.
- http://www.tsg.ne.jp/TT/software/ (retrieved on Aug. 25, 2016).