References
- K. W. Lee, C. J. Jeon, Y. H. Jeong, J. S. Yun, J. H. Nam, J. H. Cho, J. H. Paik, and J. W. Yoon, J. Korean Inst. Electr. Electron. Mater. Eng., 27, 452 (2014). [DOI: http://dx.doi.org/10.4313/JKEM.2014.27.7.452]
- K. W. Lee, C. J. Jeon, Y. H. Jeong, J. S. Yun, J. H. Cho, J. H. Paik, and J. W. Yoon, J. Korean Inst. Electr. Electron. Mater. Eng., 27, 825 (2014). [DOI: http://dx.doi.org/10.4313/JKEM.2014.27.12.825]
- D. A. Kukuruznyak, S. A. Bulkley, K. A. Omland, F. S. Ohuchi, and M. C. Gregg, Thin Solid Films, 385, 89 (2001). [DOI: https:/doi.org/10.1016/S0040-6090(00)01890-3]
- S. W. Ko, J. Li, N. J. Podraza, E. C. Dickey, and S. T. McKinstry, J. Am. Ceram. Soc., 94, 516 (2011). [DOI: https:/doi.org/10.1111/j.1551-2916.2010.04097.x]
- C. J. Jeon, K. W. Lee, D. T. Le, Y. H. Jeong, J. S. Yun, J. H. Paik, and J. H. Cho, J. Korean Inst. Electr. Electron. Mater. Eng., 27, 809 (2014). [DOI: http://dx.doi.org/10.4313/JKEM.2014.27.12.809]
- S. W. Ko, J. Li, and S. T. McKinstry, Thin Solid Films, 522, 129 (2012). [DOI: https:/doi.org/10.1016/j.tsf.2012.08.047]
- S. Fay, U. Kroll, C. Bucher, E. V. Sauvain, and A. Shah, Sol. Energy Mater. Sol. Cells, 86, 385 (2005). [DOI: https:/doi.org/10.1016/j.solmat.2004.08.002]
- D. T. Le, C. J. Jeon, K. W. Lee, Y. H. Jeong, J. S. Yun, D. H. Yoon, and J. H. Cho, J. Alloys Compd., 650, 415 (2015). [DOI: https:/doi.org/10.1016/j.jallcom.2015.07.236]
- L. He, G. Zhang, and Z. Y. Ling, Mater. Lett., 128, 144 (2014). [DOI: https:/doi.org/10.1016/j.matlet.2014.04.136]
- Y. Q. Gao, Z. M. Huang, Y. Hou, J. Wu, W. Zhou, C. OuYang, J. G. Huang, J. C. Tong, and J. H. Chu, Mater. Sci. Eng., B185, 74 (2014). [DOI: https:/doi.org/10.1016/j.mseb.2014.02.011]
- G. Ji, A. Chang, J. Xu, H. Zhang, J. Hou, B. Zhang, and P. Zhao, Mater. Lett., 107, 103 (2013). [DOI: https:/doi.org/10.1016/j.matlet.2013.05.079]
- G. Ji, A. Chang, H. Li, Y. Xie, H. Zhang, and W. Kong, Mater. Lett., 130, 127 (2014). [DOI: https:/doi.org/10.1016/j.matlet.2014.05.091]