References
- B. R. Bennett, R. Magno, J. B. Boos, W. Kruppa, and M. G. Ancona, Solid-state Electronics. 49, 1875 (2005) https://doi.org/10.1016/j.sse.2005.09.008
- Z. Dobrovolskis, K. Grigoras, and A. Krotkus, Appl. Phys. A: Solids Surf. 48, 245 (1989). https://doi.org/10.1007/BF00619393
- I. Vurgaftman, J. R. Meyer, and L. R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001). https://doi.org/10.1063/1.1368156
- A. G. Milnes and A. Y. Polyakov, Mater. Sci. Eng. B 18, 237 (1993). https://doi.org/10.1016/0921-5107(93)90140-I
- Yu. G. Sadofyev, A. Ramamoorthy, B. Naser, J. P. Bird, S. R. Johnson, and Y-H. Zhang, Appl. Phys. Lett. 81, 1833 (2002). https://doi.org/10.1063/1.1504882
- P. R. Hammar, and M. Johnson, Phys. Rev. Lett. 88, 066806-1 (2002). https://doi.org/10.1103/PhysRevLett.88.066806
- A. Zakharova, I. Lapushkin, K. Nilsson, S. T. Yen, and K. A. Chao, Phys. Rev. B 73, 125337 (2006). https://doi.org/10.1103/PhysRevB.73.125337
- J. B. Boos, B. R. Bennett, N. A. Papanicolaou, M. G. Ancona, J. G. Champlain, R. Bass, and B. V. Shanabrook, Electronics Letters 43 (2007) 834. https://doi.org/10.1049/el:20071305
- B. R. Bennett, M. G. Ancona, and J. B. Boos, Mrs Bulletin 34 (2009) 530. https://doi.org/10.1557/mrs2009.141
- H. Rodilla, T. Gonzalez, D. Pardo, and J. Mateos, J. Appl. Phys. 105, 113705 (20009). https://doi.org/10.1063/1.3132863
- G. Tuttle, H. Kroemer and J. H. English, J. Appl. Phys. 67, 3032 (1990). https://doi.org/10.1063/1.345426
- B. R. Bennett, B. V. Shanabrook, and E. R. Glaser, Appl. Phys. Lett. 65, 598 (1994). https://doi.org/10.1063/1.112955
- S. H. Shin, J. Y. Lim, J. D. Song, H. J. Kim, S. H. Han, and T. G. Kim, J. Korean Phys. Soc. 53, 2719 (2008). https://doi.org/10.3938/jkps.53.2719
- B. P. Tinkham, B. R. Bennett, R. Magno, B. V. Shanabrook, and J. B. Boos, J. Vac. Sci. Technol. B 23, 1441 (2005). https://doi.org/10.1116/1.1941147
- B. R. Bennett, B. P. Tinkham, J. B. Boos, M. D. Lange, and R. Tsai, J. Vac. Sci. Technol. B 22, 688 (2004). https://doi.org/10.1116/1.1667507
- A. Tahraoui, P. Tomasini, L. Lassabatere, and J. Bonnet, Appl. Surf. Sci. 162-163, 425 (2000). https://doi.org/10.1016/S0169-4332(00)00227-0
- Y. W. Jung, T. H. Ghong, J. S. Byun, Y. D. Kim, H. J. Kim, Y. C. Chang, S. H. Shin, and J. D. Song, Appl. Phys. Lett. 94, 231913 (2009). https://doi.org/10.1063/1.3153127
- Y. C. Lin, H. Yamaguchi, E. Y. Chang, Y. C. Hsieh, M. Ueki, Y. Hirayama, and C. Y. Chang, Appl. Phys. Lett. 90, 023509 (2007). https://doi.org/10.1063/1.2431567
- C. Nguyen, B. Brar, C. R. Bolognesi, J. J. Pekarik, H. Kroemer, and J. H. English J. Electronic Materials 22, 255 (1993). https://doi.org/10.1007/BF02665035