Information Display (인포메이션 디스플레이)

The Korean Infomation Display Society (한국정보디스플레이학회)
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  • 조복래 (한국표준과학연구원 첨단측정장비센터)
  • Published : 2016.08.31
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References

  1. T.Hibi, J.Electron Microsc. 3, 15 (1955).
  2. S.Maruse and Y.Sakaki, Optik. 15, 485 (1958).
  3. T.Everhart, J.Appl.Phys. 38, 223 (1967). https://doi.org/10.1063/1.1708959
  4. 河合七雄 他 1978 ホウ化ランタンに関する研究 (科学技術庁無機材質研究所報告書)
  5. L. W. Swanson and G. A. Schwind, in Handbook of Charged Particle Optics, edited by J. Orloff (CRC, New York, 1997), Chap. 2, p.77.
  6. L. W. Swanson and G. A. Schwind, Handbook of Charged Particle Optics (CRC Press, Boca Raton, 2009), pp1-28.
  7. Lynwood W. Swanson, Gregory A. Schwind, Sean M. Kellogg, and Kun Liu, J. Vac. Sci. Technol. B 30, 06F603 (2012). https://doi.org/10.1116/1.4756935
  8. A. S. Bahm, G. A. Schwind and L. W. Swanson, J. Appl. Phys. 110, 054322 (2011). https://doi.org/10.1063/1.3632064
  9. K. Liu, G. A. Schwind, L. W. Swanson, and J. A. Campbell, J. Vac. Sci. Technol. B 28, C6C26 (2010). https://doi.org/10.1116/1.3501362
  10. A. S. Bahm, G. A. Schwind and L. W. Swanson, J. Vac. Sci. Technol. B 26, 2080 (2008). https://doi.org/10.1116/1.2978403
  11. K. Liu, G. A. Schwind and L. W. Swanson, J. Vac. Sci. Technol. B 27, 2547 (2009). https://doi.org/10.1116/1.3259954
  12. G. A. Schwind, G. Magera and L. W. Swanson, J. Vac. Sci. Technol. B 24, 2897 (2006). https://doi.org/10.1116/1.2366675
  13. M. S. Bronsgeest and P. Kruit, Ultramicroscopy 110, 1243 (2010). https://doi.org/10.1016/j.ultramic.2010.05.004
  14. M. S. Bronsgeest, Physics of Schottky Electron Sources, Ph.D. thesis, Delft University, 2009.
  15. G. H. Jansen, "Coulomb interactions in particle beams," in Advances in Electronics and Electron Physics, Supplement, edited by P. W. Hawkes (Academic, Boston, 1990), Suppl. 21. P.
  16. Boklae Cho, Kokubo Shigeru and Chuhei Oshima, Rev. Sci. Instrum. 84, 013305 (2013). https://doi.org/10.1063/1.4776182
  17. Yuji Kohno, Eiji Okunishi, Takeshi Tomita, Isamu Ishikawa, Toshikatsu Kaneyama, Yoshihiro Ohkura, Yukihito Kondo and Thomas Isabell, Microscopy and Analysis Nov, 59 (2010).
  18. K. Kasuya, S. Kokubo, S. Katagiri, and T. Ohshima, J. Vac. Sci. Technol. B 28, L55 (2010). https://doi.org/10.1116/1.3488988