Acknowledgement
Supported by : 한국연구재단, 정보통신기술진흥센터
References
- C. Elbert and C. Jones, "Embedded software: facts, figures, and future," IEEE Computer, Vol. 42, No. 4, pp. 42-52, Apr. 2009.
- I. Fredriksen, "Choosing a MCU for your next design; 8 bit or 32 bit?," Atmel Corp., 2014.
- Clang/LLVM. [Online]. Available: http://llvm.org.
- D. Brumley, T. Chiueh, R. Johnson, H. Lin, and D. Song, "RICH: Automatically protecting against integerbased vulnerabilities," Proc. of the Symposium on Network and Distributed Systems Security, 2007.
- W. Dietz, P. Li, J. Regehr, and V. Adve, "Understanding integer overflow in C/C++," ACM Transactions on Software Engineering and Methodology, Vol. 25, No. 1, pp. 2:1-2:20, 2015.
- P. Chen, Y. Wang, Z. Xin, B. Mao, and L. Xie, "BRICK: A binary tool for run-time detecting and locating integer-based vulnerability," Proc. of the International Conference on Availability, Reliability and Security, pp. 208-215, 2009.
- D. Molnar, X. Li, and D. Wagner, "Dynamic test generation to find integer bugs in x86 binary Linux programs," Proc. of the USENIX Security Symposium, pp. 67-82, 2009.
- N. Nethercote and J. Seward, "Valgrind: A program supervision framework," Proc. of the Workshop on Runtime Verification, 2003.
- R. Rodrigues, V. Campos, and F. Pereira, "A fast and low-overhead technique to secure programs against integer overflows," Proc. of the IEEE/ACM International Symposium on Code Generation and Optimization, pp. 1-11, 2013.
- Y. Kim, M. Kim, and Y. Jang, "CREST-BV: An improved concolic testing technique supporting bitwise operations for embedded software," Journal of KIISE: Software and Applications, Vol. 40, No. 2, pp. 90-98, 2013. (in Korean)
- Y. Kim, Y. Kim, T. Kim, G. Lee, Y. Jang, and M. Kim, "Automated unit testing of large industrial embedded software using concolic testing," Proc. of the IEEE/ACM Automated Software Engineering Experience track, pp. 519-528, Nov. 2013.