전자공학회지 (The Magazine of the IEIE)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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공장 자동화를 위한 광학 방식 삼차원 측정 기술 연구

  • 장효영 (LG전자 소재/생산기술원) ;
  • 노영준 (LG전자 소재/생산기술원)
  • 발행 : 2016.11.25
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참고문헌

  1. Automoblog.net, http://www.automoblog.net/2016/08/06/inside-bmws-optical-measuring-cell/
  2. W. Huang and R. Kovacevic, "A Laser-Based Vision System for Weld Quality Inspection", Sensors 2011, 11(1), pp.506-521. https://doi.org/10.3390/s110100506
  3. M. G. Gustafsson, "Nonlinear structured -illumination microscopy: Wide-field fluorescence imaging with theoretically unlimited resolution", Proc Natl Acad Sci USA, 2005, 102(37)
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  6. Quality Manufacturing Today, http://www.qmtmag.com/display_eds.cfm?edno=2497063
  7. Micro-Epsilon, http://www.micro-epsilon.com/press/release/PR240-reflectCONTROL/index.html
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  9. Y. Roh, S. Kim, H. Shim, D. Lim, and D. Jeong, "A patterned illumination and phase integration imaging method for high-glossy surface evaluation", Proc. of 2010 International Symposium on Optomechatronic Technologies(ISOT2010), 2010.
  10. J. Bhang, S. Lee, K. Chang, and Y. Roh, "High speed Tilted white-light Scanning Interferometry system for package bumps inspection", Proc. of 2012 International Symposium on Optomechatronic Technologies(ISOT 2012), 2012.
  11. R. Berger, T. Sure, and W. Osten, "Measurement Errors of Mirrorlike, Tilted Objects in White Light Interferometry," Proc. of the SPIE on Optical Measurement Systems for Industrial Inspection V, Vol. 6616, Paper No. 2E, 2007.
  12. Y.-S. Ghim, and A. Davies, "Complete Fringe Order Determination in Scanning White-light Interferometry using a Fourier-based Technique," Applied Optics, Vol. 51, No. 12, pp. 1922-1928, 2012. https://doi.org/10.1364/AO.51.001922
  13. Y. Zhou, Y.-S. Ghim, A. Fard, and A. Davies, "Application of the Random Ball Test for Calibrating Slope-dependent Errors in Profilometry Measurements," Applied Optics, Vol. 52, No. 24, pp. 5925-5931, 2013. https://doi.org/10.1364/AO.52.005925