References
- C. L. Melcher and J. S. Schweitzer, IEEE Trans. Nucl. Sci., 39, 502 (1992). https://doi.org/10.1109/23.159655
- D. Pauwels, N. Le Masson, B. Viana, A. Kahn Harari, E. V. D. van Loef, P. Dorenbos and C.W.E. van Eijk, IEEE Trans. Nucl. Sci., 47, 1787 (2000). https://doi.org/10.1109/23.914446
- L. Pidol, B. Viana, A. Bessiere, A. Galtayries, P. Dorenbos and B. Ferrand, Mater. Sci. Forum, 555, 371 (2007). https://doi.org/10.4028/www.scientific.net/MSF.555.371
- K. Takagi and T. Fukazawa, Appl. Phys. Lett., 42, 43 (1983). https://doi.org/10.1063/1.93760
- C. Yan, G. Zhao, Y. Hang, L. Zhang and J. Xu, J. Cryst. Growth, 281, 411 (2005). https://doi.org/10.1016/j.jcrysgro.2005.04.038
- C. Yan, G. Zhao, Y. Hang, L. Zhang and J. Xu, Mater. Lett., 60, 1960 (2006). https://doi.org/10.1016/j.matlet.2005.12.101
- H. Feng, D. Ding, H. Li, S. Lu, S. Pan, X. Chen and G. Ren, J. Alloy. Compd., 509, 3855 (2011). https://doi.org/10.1016/j.jallcom.2010.12.124
- C. Mansuy, R. Mahiou and J. M. Nedelec, Chem. Mater., 15, 3242 (2003). https://doi.org/10.1021/cm034412t
- C. Mansuy, C. Dujardin, R. Mahiou and J .M. Nedelec, Opt. Mater., 31, 1334 (2009). https://doi.org/10.1016/j.optmat.2008.10.008
- D. Boyer, G Bertrand-Chadeyron, R. Mahiou, L. Lou, A. Brioude and J. Mugnier, Opt. Mater., 16, 21 (2001). https://doi.org/10.1016/S0925-3467(00)00055-0
- J. Sokolnicki and M. Guzik, Opt. Mater., 31, 826 (2009). https://doi.org/10.1016/j.optmat.2008.09.006
- D. Y. Shin, G. Cao and K. N. Kim, Curr. Appl. Phys., 11, S309 (2011). https://doi.org/10.1016/j.cap.2010.11.028
- H. L. Li, X. J. Liu, R. J. Xie, Y. Zeng and L. P. Hung, J. Am. Ceram. Soc., 87, 2536 (2006).
- C. Mansuy, J. M Nedelec, C. Dujardin and R. Mahiou, J. Sol-Gel Sci. Technol., 32, 253 (2004). https://doi.org/10.1007/s10971-004-5797-1
- Z. Zhu, B. Liu, C. Cheng, Y. Yi, H. Chen and M. Gu, Appl. Phys. Lett., 102, 071909 (2013). https://doi.org/10.1063/1.4793303