Journal of ILASS-Korea (한국분무공학회지)

Institute for Liquid Atomization and Spray Systems-Korea (한국분무공학회)
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Development of Two-color Radiation Thermometer for Harsh Environments

  • Received : 2016.10.12
  • Accepted : 2016.11.18
  • Published : 2016.12.30
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Abstract

Many industrial processes require reliable temperature measurements in harsh environments with high temperature, dust, humidity, and pressure. However, commercially-available conventional temperature measurement devices are not suitable for use in such conditions. This study thus proposes a reliable, durable two-color radiation thermometer (RT) for harsh environments that was developed by selecting the appropriate components, designing a suitable mechanical structure, and compensating environmental factors such as absorption by particles and gases. The two-color RT has a simple, compactly-designed probe with a well-structured data acquisition system combined with efficient LabVIEW-based code. As a result, the RT can measure the temperature in real time, ranging from 300 to $900^{\circ}C$ in extremely harsh environments, such as that above the burden zone of a blast furnace. The error in the temperature measurements taken with the proposed two-color RT compared to that obtained using K-type thermocouple readouts was within 6.1 to $1.4^{\circ}C$ at a temperature range from 200 to $700^{\circ}C$. The effects of absorption by gases including $CO_2$, CO and $H_2O$ and the scattering by fine particles were calculated to find the transmittance of the two wavelength bands of operation through the path between the measured burden surface and the two-color probe. This method is applied to determine the transmittance of the short and long wavelength bands to be 0.31 and 0.51, respectively. Accordingly, the signals that were measured were corrected, and the true burden surface temperature was calculated. The proposed two-color RT and the correction method can be applied to measure temperatures in harsh environments where light-absorbing gases and scattering particles exist and optical components can be contaminated.

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References

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