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Suppressing Lateral Conduction Loss of Thin-film Cathode by Inserting a Denser Bridging Layer

  • Park, Jung Hoon (High-Temperature Energy Materials Research Center, Korea Institute of Science and Technology) ;
  • Lee, Seung Hwan (High-Temperature Energy Materials Research Center, Korea Institute of Science and Technology) ;
  • Kim, Hyoungchul (High-Temperature Energy Materials Research Center, Korea Institute of Science and Technology) ;
  • Yoon, Kyung Joong (High-Temperature Energy Materials Research Center, Korea Institute of Science and Technology) ;
  • Lee, Jong-Ho (High-Temperature Energy Materials Research Center, Korea Institute of Science and Technology) ;
  • Han, Seung Min (Graduate School of EEWS, Korea Advanced Institute of Science and Technology) ;
  • Son, Ji-Won (High-Temperature Energy Materials Research Center, Korea Institute of Science and Technology)
  • Received : 2015.07.09
  • Accepted : 2015.08.12
  • Published : 2015.09.30

Abstract

To reduce the lateral conduction loss of thin-film-processed cathodes, the microstructure of the thin-film cathode is engineered to contain a denser bridging layer in the middle. By doing so, the characteristic crack-like pores that separate the cathode domains in thin-film-processed cathodes and hamper lateral conduction are better connected and, as a result, the sheet resistance of the cathode is effectively reduced by a factor of 5. This induces suppression of the lateral conduction loss and expansion of the effective current collecting area; the cell performance is improved by more than 30%.

Keywords

References

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