References
- E. Y. Lee and Y. J. Kim, Electrochem. Solid-State Lett., 13, J110 (2010). https://doi.org/10.1149/1.3456549
- E. Y. Lee and Y. J. Kim, Thin Solid Films, 518, e72 (2010). https://doi.org/10.1016/j.tsf.2010.03.121
- E. Y. Lee, M. Nazarov, and Y. J. Kim, J. Eletrochem. Soc., 157, J102 (2010). https://doi.org/10.1149/1.3294556
- M. Nazarov, Y. J. Kim, E. Y. Lee, K.-I. Min, M. S. Jeong, S. W. Lee and D. Y. Noh, J. Appl. Phys., 107, 103104 (2010). https://doi.org/10.1063/1.3392918
- X. Y. Huang, J. X. Wang, D. C. Yu, S. Ye, Q. Y. Zhang and X. W. Sun, J. Appl. Phys., 109, 113526 (2011). https://doi.org/10.1063/1.3592889
- X. Xiao, B. Yan and Y. Song, Cryst. Growth Des., 9, 136 (2009). https://doi.org/10.1021/cg7010869
- K. S. Sohn, W. Zeon, H. Chang, S. K. Lee and H. D. Park, Chem. Mat., 14, 2140 (2002). https://doi.org/10.1021/cm0109701
- A. Lecointre, A. Bessiere, A. J. J. Bos, P. Dorenbos, B. Viana and S. Jacquart, J. Phys. Chem. C, 115, 4217 (2011). https://doi.org/10.1021/jp108038v
- E. Y. Lee and Y. J. Kim, ECS Meeting Abstracts, MA2009-02, #3213 (2009).
- A. K. Singh, S. K. Singh, B. K. Gupta, R. Prakash and S. B. Rai, Dalton Trans., 42, 1065 (2013). https://doi.org/10.1039/C2DT32054A
- G. Tian, Z. Gu, L. Zhou, W. Yin, X. Liu, L. Yan, S. Jin, W. Ren, G. Xing, S. Li, and Y. Zhao, Adv. Mater., 24, 1226 (2012). https://doi.org/10.1002/adma.201104741
- J. Chen, C. Guo, M. Wang, L. Huang, L. Wang, C. Mi, J. Li, X. Fang, C. Mao, and S. Xu, J. Mater. Chem., 21, 2632 (2011). https://doi.org/10.1039/c0jm02854a
- F. van de Gijke, H. Zijlmans, S. Li, T. Vail, A. K. Raap, R. S. Niedbala, and H. J. Tanke, Nat. Biotechnol., 19, 273 (2001). https://doi.org/10.1038/85734
- Z. Q. Li, X. D. Li, Q. Q. Liu, X. H. Chen, Z. Sun, C. Liu, X. J. Ye, and S. M. Huang, Nanotechnology, 23, 025402 (2012). https://doi.org/10.1088/0957-4484/23/2/025402
- V. K. Tikhomirov, V. D. Rodríguez, J. Méndez-Ramos, J. del-Castillo, D. Kirilenko, G. VanTendeloo, and V. V. Moshchalkov, Sol. Energy Mat. Sol. Cells, 100, 209 (2012). https://doi.org/10.1016/j.solmat.2012.01.019
- J. M. Jehng and I. E. Wachs, Chem. Mat., 3, 100 (1991). https://doi.org/10.1021/cm00013a025
- S. H. Shin, D. Y. Jeon, and K. S. Suh, J. Appl. Phys., 90, 5986 (2001). https://doi.org/10.1063/1.1413954
- S. K. Lee, H. Chang, C. -H. Han, H. -J. Kim, H. G. Jang, and H. D. Park, J. Solid State Chem., 156, 267 (2001). https://doi.org/10.1006/jssc.2000.8941
- D. A. Grisafe and C. W. Fritsch, J. Solid State Chem., 17, 313 (1976). https://doi.org/10.1016/0022-4596(76)90137-7
- F. Auzel, Chem. Rev., 104, 139 (2004). https://doi.org/10.1021/cr020357g