References
- H. Kim, K. Seo, B. Tabbert, and G.A. Williams, Journal of Low Temperature Physics 121, 621-626 (2000).
- H. Kim, K. Seo, B. Tabbert, and G.A. Williams, Europhysics Letters 58, 395-400 (2002). https://doi.org/10.1209/epl/i2002-00652-0
- H. Kim, P. A. Lemieux, D. J. Durian, and G.A. Williams, Phys. Rev. E 69, 0614081-0614084 (2004).
- W. Steckelmacher and M.W. Lucas, J. Phys. D: Appl. Phys., 16, 1453-1460 (1983). https://doi.org/10.1088/0022-3727/16/8/012
- L. Fustoss and G Toth, Vacuum, 40, 43-46 (1990). https://doi.org/10.1016/0042-207X(90)90115-F
- B.V. Zhmud, F. Tiberg and K. Hallstensson, Journal of Colloid and Interface Science, 228, 263-269 (2000). https://doi.org/10.1006/jcis.2000.6951
- G.Y. Hsiung, C.C. Chang, Y.C. Yang, C.H. Chang, H.P. Hsueh, S.N. Hsu and J.R. Chen, Applied Science and Convergence Technology, 23, 309-316 (2014). https://doi.org/10.5757/ASCT.2014.23.6.309
- S. J.Yu, S. J. Youn, and H. Kim, Physica B 405, 638-641 (2010). https://doi.org/10.1016/j.physb.2009.09.079
- H. Kim, S. C. Lim, and Y. H. Lee, Physics Letters A 375, 2661-2664 (2011). https://doi.org/10.1016/j.physleta.2011.05.051
- H. Kim, S. J. Youn, and S. J. Yu, Journal of the Korean Physical Society 56, 554-557(2010). https://doi.org/10.3938/jkps.56.554
- H. Kim, M.S. Han, D. Perello, and M. Yun, Infrared Physics & Technology 60, 7-9 (2013). https://doi.org/10.1016/j.infrared.2013.03.003
- H. Kim, C.S. Park, and M.S. Han, Optics Communications 325, 68-70 (2014). https://doi.org/10.1016/j.optcom.2014.04.004
- H. Kim, W. K. Kim, G.T. Park, C. S. Park, and H. D. Cho, Infrared Physics &Technology 67, 49-51(2014). https://doi.org/10.1016/j.infrared.2014.07.007
- H. Kim, W. K. Kim, G.T. Park, I. Shin, S. Choi and D. O. Jeon, Infrared Physics & Technology 67, 600-603 (2014). https://doi.org/10.1016/j.infrared.2014.10.003
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