Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
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DigitalMicrograph Script Source Listing for a Geometric Phase Analysis

  • Kim, Kyou-Hyun (Advanced Process and Materials R&BD Group, Incheon Regional Division, Korea Institute of Industrial Technology)
  • Received : 2015.04.17
  • Accepted : 2015.06.25
  • Published : 2015.06.30
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Abstract

Numerous digital image analysis techniques have been developed with regard to transmission electron microscopy (TEM) with the help of programming. DigitalMicrograph (DM, Gatan Inc., USA), which is installed on most TEMs as operational software, includes a script language to develop customized software for image analysis. Based on the DM script language, this work provides a script source listing for quantitative strain measurements based on a geometric phase analysis.

Keywords

References

  1. Buseck P R, Epelboin Y, and Rimsky A (1988) Signal processing of highresolution transmission electron microscope images using Fourier transforms. Acta Cryst. A 44, 975-986. https://doi.org/10.1107/S0108767388007500
  2. FELMI-ZFE: $DigitalMicrograph^{TM}$ script database [Internet]. Available from: http://portal.tugraz.at/portal/page/portal/felmi/DM-Script.
  3. Galindo P L, Kret S, Sanchez A M, Laval J, Yanez A, Pizarro J, Guerrero E, Ben T, and Molina S I (2007) The peak pairs algorithm for strain mapping from HRTEM images. Ultramicroscopy 107, 1186-1193. https://doi.org/10.1016/j.ultramic.2007.01.019
  4. Hytch M J (1997) Geometric phase analysis of high resolution electron microscope images. Scanning Microscopy 11, 53-66.
  5. Hytch M J, Pataux J L, and Penisson J M (2003) Measurement of the displacement field of dislocations to 0.03 A by electron microscopy. Nature 423, 270-273. https://doi.org/10.1038/nature01638
  6. Hytch M J, Snoeck E, and Kilaas R (1998) Quantitative measurement of displacement and strain fields from HREM micrographs. Ultramicroscopy 74, 131-146. https://doi.org/10.1016/S0304-3991(98)00035-7
  7. Huang W J, Zuo J M, Jiang B, Kwon K W, and Shim M S (2009) Subangstrom-resolution diffractive imaging of single nanocrystals. Nature Phys. 5, 129-133. https://doi.org/10.1038/nphys1161
  8. Kim H, Meng Y, Rouviere J L, Isheim D, Seidman D N, and Zuo J M. (2013a) Atomic resolution mapping of interfacial intermixing and segregation in InAs/GaSb superlattices: a correlative study. J. Appl. Phys. 113, 103511. https://doi.org/10.1063/1.4794193
  9. Kim K H (2013) Local symmetry and polarization in relaxor-based ferroelectric crystals, Materials Science and Engineering, (University of Illinois at Urbana-Champaign, Champaign).
  10. Kim K H, Payne D A, and Zuo J M (2012) Symmetry of piezoelectric $(1-x)Pb(Mg_{1/3}Nb_{2/3})O_{3-x}PbTiO_3(x=0.31)$ single crystal at different length scales in the morphotropic phase boundary region. Phys. Rev. B 86, 184113. https://doi.org/10.1103/PhysRevB.86.184113
  11. Kim K H, Payne D A, and Zuo J M (2013b) Determination of fluctuations in local symmetry and measurement by convergent beam electron diffraction: applications to a relaxor-based ferroelectric crystal after thermal annealing. J. Appl. Cryst. 46, 1331-1337. https://doi.org/10.1107/S0021889813022097
  12. Kim K H, Xing H, Zuo J M, Zhang P, and Wang H (2015) TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis. Micron 71, 39-45. https://doi.org/10.1016/j.micron.2015.01.002
  13. Kim K H and Zuo J M (2013) Symmetry quantification and mapping using convergent beam electron diffraction. Ultramicroscopy 124, 71-76. https://doi.org/10.1016/j.ultramic.2012.09.002
  14. Reetz M T, Maase M, Schilling T, and Tesche B (2000) Computer image processing of transmission electron micrograph pictures as a fast and reliable tool to analyze the size of nanoparticles. J. Phys. Chem. B 104, 8779-8781.
  15. Zuo J M, Vartanyants I, Gao M, Zhang R, and Nagahara L A (2003) Atomic resolution imaging of a carbon nanotube from diffraction intensities. Science 300, 1419-1421. https://doi.org/10.1126/science.1083887

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