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A Study on TE Scattering by a Conductive Strip Grating Over Grounded Two Dielectric Layers

접지된 2개 유전체층 위의 완전도체띠 격자구조에 의한 TE 산란에 관한 연구

  • 윤의중 (가천대학교 의용생체공학과)
  • Received : 2015.02.24
  • Accepted : 2015.04.10
  • Published : 2015.04.30

Abstract

In this paper, the solutions of TE (transverse electric) scattering problems by a conductive strip grating over grounded two dielectric layers are analyzed by applying the PMM (point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition apply to analysis of conducting strip. The most normalized reflected powers of the sharp variations in minimum values are scattered in direction of the other angles except incident angle. The numerical results for normalized reflected power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the two dielectric layers, and incident angles. The numerical results of present numericl analysis are shown in good agreement compared to those of the existing papers using FGMM (fourier galerkin moment method).

본 논문에서는 접지된 2개의 유전체층 위의 완전도체띠 격자구조에 의한 TE (transverse electric)산란 문제를 전자파 수치해석 방법으로 알려진 PMM (point matching method)를 이용하여 해석하였다. 경계조건들은 미지의 계수를 구하기 위하여 이용하였고, 산란 전자계는 Floquet 모드 함수의 급수로 전개하였고, 도체띠의 해석을 위해 완전도체 경계조건을 적용하였다. 최소값을 가지는 변곡점들의 대부분의 반사전력은 입사각 이외의 다른 방향으로 산란된다. 완전도체띠의 폭과 주기, 2개 유전층의 비유전율과 두께 및 입사각에 대해 정규화된 반사전력을 계산하였다. 제안한 방법의 수치결과들은 기존의 FGMM (fourier galerkin moment method)를 이용한 수치해석 결과들과 비교하여 매우 잘 일치하였다.

Keywords

References

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